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Aging test fixture

A technology for aging testing and fixtures, which is applied in the direction of power supply testing, measuring devices, and measuring electrical variables. It can solve problems such as deformation, ACPIN heat and force, etc., and achieve high test safety and more controllable power-on or power-off. Effect

Inactive Publication Date: 2017-01-18
GUANGDONG XIAOTIANCAI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the invention discloses an aging test fixture to solve the problem that the AC PIN of the product is deformed by heat or force

Method used

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Examples

Experimental program
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Embodiment 1

[0064] Please also refer to figure 1 , Figure 2 to Figure 7 , is a structural diagram of the jig 100 (with the cover plate and positioning parts omitted) provided in Embodiment 1 of the present invention.

[0065] In this embodiment, the above-mentioned base 10 is a square shell structure, including a bottom plate 13 and a side plate 14 surrounding the periphery of the bottom plate 13. The bottom plate 13 and the side plate 14 are enclosed to form a cavity structure. The first pin 11 and The second pins 12 are all disposed on the bottom plate 13 and located in the cavity structure, so that the overall structure of the jig 100 is more compact. It can be understood that, in other embodiments, the base 10 can also be a U-shaped shell structure or a circular shell structure.

[0066] Further, in order to ensure the user's testing safety, the base 10 can be made of insulating materials, such as plastic or glass.

[0067] In this embodiment, the power interface 20 is an external...

Embodiment 2

[0095] Please also refer to Figure 10 to Figure 11 , is a simplified structural diagram of the first limiting member 70 at the initial position and the preset position provided by Embodiment 2 of the present invention. The difference between Embodiment 2 of the present invention and Embodiment 1 of the present invention lies in:

[0096] A sliding slot (not shown) is defined on the base 10 , and the first limiting member 70 is slidably connected in the sliding slot. In this embodiment, the chute is a bar-shaped chute, and the two ends of the chute are respectively set corresponding to the initial position and the preset position, for example, when the first limiting member 70 is located at the first end of the chute , the first limiting member 70 is at the initial position, and when the first limiting member 70 slides to the second end of the chute, the first limiting member 70 reaches the preset position.

[0097] Since in this embodiment, the first limiting member 70 does...

Embodiment 3

[0104] Please also refer to Figure 12 to Figure 13 , is a simplified structural diagram of the first limiting member 70 at the initial position and the preset position provided by Embodiment 3 of the present invention. The difference between embodiment three of the present invention and embodiment two is:

[0105] Both the first elastic member 50 and the second elastic member 60 are two, one end of the two first elastic members 50 is connected to the first strip 30, the other end is connected to the side wall of the base 10, and the two first elastic members The pieces 50 are respectively arranged symmetrically on both sides of the first limiting piece 70; one end of the two second elastic pieces 60 is connected to the second strip 40, and the other end is connected to the side wall of the base 10, and the two second elastic pieces 60 The pieces 60 are arranged symmetrically on both sides of the second limiting piece 15 and opposite to the two first limiting pieces 70 . Spe...

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PUM

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Abstract

An aging test fixture comprises a base, a power interface arranged on the base, a first batten, a second batten, a first elastic piece, a second elastic piece, and a first limit piece. The base is provided with a first pin and a second pin. The first batten is arranged on the base in a sliding way, and is provided with a first conductive contact electrically connected with the power interface in a position corresponding to the first pin. The second batten is arranged on the base in a sliding way, and is provided with a second conductive contact electrically connected with the power interface in a position corresponding to the second pin. The first elastic piece and the second elastic piece are connected to the first batten and the second batten respectively. The first limit piece is movably connected to a bottom plate, and the first limit piece can move to a preset position and drive the first conductive contact and the second conductive contact to abut on the first pin and the second pin respectively so as to realize electric conduction. By implementing the fixture provided by the embodiment of the invention, the first pin and the second pin can be prevented from deforming under stress and heat and rolling outward along the two sides of the base, and that the spacing of the first pin and the second pin complies with safety requirements is ensured.

Description

technical field [0001] The invention relates to the technical field of product testing, in particular to an aging test fixture. Background technique [0002] At present, during the aging process of products in the entire industry of chargers and adapters, it is usually necessary to test the aging conditions of chargers and adapters. Traditional aging fixtures usually use universal sockets to test the aging of chargers and adapters. [0003] However, since the spacing of AC pins (AC PIN) of chargers and adapters usually needs to comply with the control requirements of safety regulations, the fixed spacing of the live wire / neutral wire (L / N) of the traditional universal socket is used in the process of product aging. It is easily affected by self-heating, external ambient temperature or external force (such as the dimensional tolerance factor between the AC holes of the universal universal socket), so that the plastic support of the AC PIN input end of the product will be def...

Claims

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Application Information

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IPC IPC(8): G01R31/42G01R1/04
CPCG01R1/0416G01R31/42
Inventor 杨子敏吴新广王志远
Owner GUANGDONG XIAOTIANCAI TECH CO LTD
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