Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Time domain quasi-explicit method for analyzing electromagnetic scattering characteristic of dielectric target

A technology of electromagnetic scattering characteristics and medium targets, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problem of low solution efficiency and achieve the effect of efficient solution

Active Publication Date: 2017-01-04
NANJING UNIV OF SCI & TECH
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the analyzed medium target has highly inhomogeneous permittivity or multi-scale, grid processing becomes a difficult problem for ordinary time-domain volume integral equations, although the time-domain integration of non-conformal grids can be used Equation method for analysis, but due to the relatively dense iteration matrix, the solution efficiency is low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Time domain quasi-explicit method for analyzing electromagnetic scattering characteristic of dielectric target
  • Time domain quasi-explicit method for analyzing electromagnetic scattering characteristic of dielectric target
  • Time domain quasi-explicit method for analyzing electromagnetic scattering characteristic of dielectric target

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0071] In order to verify the accuracy and high efficiency of the method of the present invention, the analysis of the transient electromagnetic characteristics of the dielectric target of a dielectric spherical shell is given below, wherein the inner radius of the spherical shell is 0.25m, the thickness is 0.05m, and the relative dielectric The constant is 2, such as figure 1 . The calculated results of the bistatic RCS for transient electromagnetic scattering are in good agreement with the calculated results of the analytical value Mie. figure 2 shown, and verified the current stability at the (-0.239,-0.091,0.067) position, such as image 3 .

[0072] In this example, the incident electric field is modulated Gaussian plane wave, and its expression is as follows:

[0073] E i n c ( r , t ) = P ^ ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a time domain quasi-explicit method for analyzing electromagnetic scattering characteristic of a dielectric target. The method comprises the following steps: building a time domain volume integral equation; discretizing a to-be-solved unknown quantity by adopting a temporal basis function in time domain and adopting a non-conformal tetrahedral mesh in space domain; forming a to-be-solved matrix equation, wherein unknown current is a medium transient state body current; efficiently solving a matrix equation by utilizing a quasi-explicit method, so as to obtain a transient state body current coefficient of medium, and then determining transient state electromagnetic scattering parameters according to the body current coefficient. The time domain quasi-explicit method disclosed by the invention has the advantages that a non-conformal time domain volume integral equation method solved by utilizing a quasi-explicit method can flexibly process grid discretization of a to-be-solved target, and a formed relative dense iterative matrix can accelerate solution by utilizing the advantages of the quasi-explicit method.

Description

[0001] a technical field [0002] The invention belongs to the technical field of electromagnetic simulation, in particular to a time-domain quasi-explicit method for analyzing the electromagnetic scattering characteristics of a medium target. [0003] Two background technology [0004] The analysis of electromagnetic scattering characteristics of medium targets is a very important research field in electromagnetic problems. The physical quantities such as the shape and volume of radar targets are calculated by calculating parameters such as radar scattering cross section, and the radar An important indicator of "observability". Therefore, the research on the scattering characteristics of various targets has particularly important practical significance in these application fields. [0005] In recent years, with the rapid development of broadband electromagnetic scattering systems, the analysis of transient electromagnetic scattering characteristics has attracted more and more...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/50
Inventor 陈如山丁大志樊振宏呼延龙
Owner NANJING UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com