Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Double-layer integrated type industrial process fault detection method based on modified independent component analysis (MICA)

An independent meta-analysis and fault detection technology, applied in electrical testing/monitoring, testing/monitoring control systems, instruments, etc., to achieve the effects of improving reliability and applicability, strong interpretability, and variable interpretability

Active Publication Date: 2016-10-26
NINGBO UNIV
View PDF6 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the types of faults that may occur in the process are unknown, and the historical data available for reference are also very limited. How to determine the non-quadratic function and how to select important independent component components are two key issues to be solved in the field of non-Gaussian process monitoring. sexual problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-layer integrated type industrial process fault detection method based on modified independent component analysis (MICA)
  • Double-layer integrated type industrial process fault detection method based on modified independent component analysis (MICA)
  • Double-layer integrated type industrial process fault detection method based on modified independent component analysis (MICA)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0019] As shown in Figure 1, the present invention relates to a two-layer integrated industrial process fault detection method based on modified independent element analysis, which aims at two inevitable problems in the process of establishing a non-Gaussian process fault model: how to determine Non-quadratic functions and how to select important independent element components, firstly use all the selection possibilities to establish multiple MICA fault detection models sequentially. Second, monitor the same process object with these multiple MICA models. Finally, the two-layer Bayesian probability fusion method is used to integrate different fault detection results into one, so as to facilitate the final fault decision.

[0020] Concrete implementation steps of the present invention are as follows:

[0021] Step 1: Use the process data acq...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a double-layer integrated type industrial process fault detection method based on modified independent component analysis. The double-layer integrated type industrial process fault detection method mainly solves two problems which are unavoidable in the establishment process of non-Gaussian process fault models: one is how to determine non-quadratic functions so as to measure magnitude of non-Gaussianity, the other is how to select important independent components to establish the models. The double-layer integrated type industrial process fault detection method comprises the steps of: firstly, utilizing all selection possibilities to establish a plurality of MICA fault detection models in sequence; secondly, monitoring the same process data by means of the plurality of MICA fault detection models; and finally, adopting a double-layer Bayesian probability fusion method to integrate different fault detection results into one result, so as to facilitate the final fault decision-making. The double-layer integrated type industrial process fault detection method provided by the invention can minimize the fault missing report rate caused by the wrong selection of the non-quadratic functions or ranking criteria, and greatly improves the reliability and applicability of the corresponding fault detection models.

Description

technical field [0001] The invention relates to an industrial process fault detection method, in particular to a double-layer integrated industrial process fault detection method based on modified independent element analysis. Background technique [0002] Ensuring the production safety of industrial processes and the stability of product quality is a necessary means to improve the profitability of enterprises. Therefore, reliable and accurate fault detection methods are an indispensable part of the entire industrial control system. Considering the large-scale and complex trend of modern industrial process, the data-driven fault detection method has gradually replaced the fault detection method based on the mechanism model, and has become the mainstream technical means in the field of fault detection research. However, the data collected by modern industrial processes usually exhibits non-Gaussian properties, and prior knowledge about process data and possible fault types is...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05B23/02
CPCG05B23/0218
Inventor 童楚东蓝艇
Owner NINGBO UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products