Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A calibratable resistance device and integrated circuit

A technology for calibrating resistance and reference resistance, which is applied in the direction of electric solid-state devices, circuits, electrical components, etc., can solve the problems of long resistance adjustment period, achieve the effects of reducing occupied area, shortening resistance adjustment period, and increasing or decreasing resistance value

Active Publication Date: 2019-01-29
SOI MICRO CO LTD
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the present invention solves the technical problem that the existing calibratable resistors have a long resistance adjustment period by providing a calibratable resistor device and an integrated circuit

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A calibratable resistance device and integrated circuit
  • A calibratable resistance device and integrated circuit
  • A calibratable resistance device and integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0021] refer to figure 1 As shown, the calibratable resistor device provided by the embodiment of the present invention includes: a reference resistor 100 , a calibration resistor array 101 , a routing resource block 102 , a first resistor port 103 , a second resistor port 104 , and a configuration port 105 .

[0022] The first terminal of the re...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a calibratable resistance device and an integrated circuit. The calibratable resistance device includes a reference resistor, a calibration resistor array, a routing resource block, a first resistor port, a second port and a configuration port; the first pole end of the reference resistor is connected with the first pole end of the calibration resistor array; the second pole end of the calibration resistor array is connected with the first resistor port; the second pole end of the reference resistor is connected with the second port; the wiring input end of the calibration resistor array is connected with the wiring output end of the routing resource block; and the configuration input end of the routing resource block is connected with the configuration port. With the calibratable resistance device and the integrated circuit of the invention adopted, the technical problem of a long cycle for realizing resistance value adjustment of an existing calibratable resistor can be solved, and a design cycle is effectively shortened.

Description

technical field [0001] The invention relates to the field of semiconductors, in particular to a calibrated resistance device and an integrated circuit. Background technique [0002] With the maturity of integrated circuit design technology and the shortening of product development cycle, in order to improve the success rate of tape-out in the process of integrated circuit design, the demand for calibrated circuit structure with preset parameters in the circuit is increasing. Calibrate the circuit through redundant MOS devices The width-to-length ratio of the reserved resistance and capacitance structure calibration circuit voltage, current and other key parameters. [0003] At present, the resistance calibration schemes used in integrated circuits mainly include: reserve redundant resistance structures in the circuit design process, connect or short-circuit redundant resistances through FIB and reconstruction lead methods, and realize the modification of key node resistance ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/118
CPCH01L27/118
Inventor 郝宁
Owner SOI MICRO CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com