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Complex test scene-based test data recovery method

A technique for recovering tests and test scenarios, applied in the field of testing, to achieve the effect of improving test work efficiency

Inactive Publication Date: 2016-09-28
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a method for recovering test data based on complex test scenarios in view of the current needs and the deficiencies in the development of the prior art

Method used

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  • Complex test scene-based test data recovery method

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Embodiment

[0015] The method for recovering test data based on complex test scenarios described in this embodiment is operated through a visual interface, and the R&D and testing work is streamlined from the creation of requirements to the development of R&D and testing work, and the creation of requirements is the beginning of the process. , taking the R&D progress as one of the growth records of the process. After the R&D is completed, the R&D personnel will submit it to the tester; after the tester completes the test, the requirement will be closed.

[0016] Based on the method for recovering test data in complex test scenarios described in this embodiment, a test data recovery system is created to quickly recover the original test data through a visual interface. The main steps include:

[0017] Step 1, save the operation log; during the test process, the code logic will record the operation of each step, and for the addition, deletion, modification and query of the database, the corr...

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Abstract

The invention discloses a complex test scene-based test data recovery method and relates to the technical field of tests. The method is used for creating a test data recovery system and quickly recovering original test data through a visual interface. The method comprises the main steps of 1, storing an operation log; 2, developing a visual program; and 3, executing a corresponding script file to recover the test data. Through the method, test personnel can quickly recover the original test data only by starting the test data recovery system, selecting a path of the operation log and clicking recovery without re-preparing test data of a same scene, so that the test work efficiency is greatly improved.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method for recovering test data based on complex test scenarios. Background technique [0002] In the process of software testing, in order to cover the code logic, testers will create a lot of targeted test data according to the test cases. For simple test data, the preparation is relatively simple, but for complex test scenarios, testers often need to create a lot of Test Data. [0003] During the testing process, some operations may add, delete, or modify the original test data. When testing the same scenario, the tester needs to prepare the same data again, because the previous data cannot be used due to changes. This brings a lot of repetitive work to the testers, resulting in low test efficiency and a waste of manpower and time. Contents of the invention [0004] The present invention provides a method for recovering test data based on complex test scenarios, aiming a...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3688
Inventor 刘娜
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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