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Method and device for controlling intelligent device to enter factory test mode

A technology for factory testing and smart devices, applied in TVs, electrical components, image communications, etc., to avoid the possibility of entering the factory test mode, improve test efficiency, and reduce the risk of operational errors

Inactive Publication Date: 2016-08-24
LE SHI ZHI ZIN ELECTRONIC TECHNOLOGY (TIANJIN) LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The embodiment of the present invention provides a method and device for controlling smart devices to enter the factory test mode, which is used to solve the defect in the prior art that requires manual input of remote control combination keys to enter the factory test mode, and realize automatic control of smart devices to enter the factory test mode

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  • Method and device for controlling intelligent device to enter factory test mode
  • Method and device for controlling intelligent device to enter factory test mode

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Embodiment Construction

[0028] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0029] A method for controlling a smart device to enter the factory test mode provided by an embodiment of the present invention is as follows: figure 1 As shown, it specifically includes the following operations:

[0030] Step 100, when it is necessary to perform a factory test on the smart device, obtain the code scanning information obtained b...

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Abstract

An embodiment of the invention provides a method and device for controlling an intelligent device to enter a factory test mode. When factory tests need to be conducted on the intelligent device, the method comprises the following steps: code scanning information obtained via a code scanning mode is acquired, and the code scanning information is compared with preset test information stored in the intelligent device; if the code scanning information is same as the preset test information, and a factory test application program stored in the intelligent device is called to run engineering tests on the intelligent device. Or, factory test files are searched in a designated storage space; if the factory test files are found out, the factory test application program stored in the intelligent device is called to run the factory tests on the intelligent device. Compared with a remote controller combination key-based mode, the method is advantaged by reduction of maloperation risks and improvement of testing efficiency. Moreover, the intelligent device enters the factory test mode without remote controller combination press key identifying operation, and possibility that a user enters the factory test mode can be prevented.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of testing, and in particular to a method and device for controlling a smart device to enter a factory test mode. Background technique [0002] Before the smart device leaves the factory, factory testing is required to prevent errors in the production process of the smart device from causing hardware problems, abnormal basic functions of the smart device, etc., and to ensure the quality of the marketed products through factory testing. Taking the OTT (Over The Top, which refers to providing various application services to users through the Internet) smart set-top box as an example, after the assembly is completed, a series of important information burning tests, basic function tests, interface tests, etc. factory test. [0003] The current factory test solution has a factory test application built into the smart device. The factory test application is hidden and not visible to the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
Inventor 傅斌
Owner LE SHI ZHI ZIN ELECTRONIC TECHNOLOGY (TIANJIN) LTD
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