Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

esd testing device and esd testing method

A test device and test method technology, applied in the direction of testing dielectric strength, etc., can solve the problems of inability to find interruption points and low test efficiency, and achieve the effects of improving test efficiency, realizing relay functions, and simplifying the test process

Active Publication Date: 2018-10-26
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As the number of test points increases, the risk of missing and overtesting also increases, and when the test is interrupted by external interference, it is very easy to fail to find the interruption point, making the test efficiency low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • esd testing device and esd testing method
  • esd testing device and esd testing method
  • esd testing device and esd testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] In order to further illustrate the technical means adopted by the present invention and its effects, the following describes in detail in conjunction with preferred embodiments of the present invention and accompanying drawings.

[0034] see figure 2 , the present invention at first provides a kind of ESD testing device, comprises: test module 1, the gating module 2 that is electrically connected with described test module 1, and the display that is electrically connected with described test module 1 and gating module 2 Module 3;

[0035] Assume that both M and N are positive integers, the test module 1 includes a plurality of parallel output channels OUT(1)-OUT(N), and a plurality of parallel test channels TP(1)-TP(M), the Multiple parallel output channels OUT(1)-OUT(N) are connected in series with the multiple parallel test channels TP(1)-TP(M);

[0036] Wherein, a plurality of parallel output channels OUT(1)~OUT(N) are used to electrically connect with a plurality...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an electro-static discharge (ESD) testing apparatus and an ESD testing method. The apparatus comprises a testing module (1), a gating module (2) connected with the testing module (1) electrically, and a display module (3) connected with the testing module (1) and the gating module (2) electrically. The testing module (1) consists of a plurality of output channels (from OUT (1) to OUT (N)) connected in parallel and a plurality of testing channels (from TP (1) to TP (M)) connected in parallel; and the multiple parallel output channels (from OUT (1) to OUT (N)) and the multiple parallel testing channels (from TP (1) to TP (M)) are connected in series. Gating of corresponding output channels can be carried out automatically by using the gating module (2) and ESD testing on a testing point can be carried out by the regulated times, so that the testing process is simplified and the testing efficiency is simplified. The display module (3) records and displays positions of the output channels after gating in real time. When the ESD testing is interrupted, an interrupted position can be found rapidly and accurately by using the display module (3) to carry out testing continuously, so that the relay function is realized.

Description

technical field [0001] The invention relates to the technical field of electrostatic discharge testing, in particular to an ESD testing device and an ESD testing method. Background technique [0002] Liquid Crystal Display (LCD) has many advantages such as thin body, power saving, and no radiation, and has been widely used, such as: LCD TV, mobile phone, personal digital assistant (PDA), digital camera, computer screen or Laptop screens, etc., dominate the field of flat panel displays. [0003] Thin Film Transistor Liquid Crystal Display (TFT-LCD) is one of the main types of flat panel display at present. The TFT-LCD controls the input of data signals through a thin film transistor switch, and then controls the screen display. [0004] Specifically, see figure 1 , the main driving principle of TFT-LCD is that the main board of the system is connected with the connector (connector) 100 on the printed circuit board 200 (Printed Circuit Board, PCB) through wires, R / G / B compre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/12
CPCG01R31/12
Inventor 黄笑宇
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com