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Testing equipment for testing the performance of laser diodes

A technology of laser diodes and detection equipment, which is applied in the direction of testing optical properties, measuring devices, optical instrument testing, etc., can solve the problems of high price and unsuitability for promotion and use, and achieve simple and convenient operation, which is conducive to popularization and use, and the overall cost is cheap Effect

Active Publication Date: 2018-04-03
APAT OPTOELECTRONICS COMPONENTS
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to overcome the defects of the prior art and provide a detection device for detecting the performance of laser diodes, so as to solve the problem that the equipment for analyzing LD performance in the prior art is not suitable for popularization and use because of its high price

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  • Testing equipment for testing the performance of laser diodes
  • Testing equipment for testing the performance of laser diodes
  • Testing equipment for testing the performance of laser diodes

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Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0029] see figure 1 , the embodiment of the testing device for testing the performance of the laser diode of the present invention will be described below.

[0030] The detection device 100 for detecting the performance of a laser diode in this embodiment includes an installation platform 10, a laser diode pose adjustment assembly 20, a laser diode holder 30, a photodiode pose adjustment assembly 40, a photodiode holder 50, Computer (not marked in the figure) and control device (not marked in the figure), the components of the testing equipment 100 for testing the performance of laser diodes are f...

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Abstract

The invention discloses a detection device for detecting performance of a laser diode, which comprises a mounting platform, a laser diode pose adjustment assembly, a laser diode clamping piece, a photodiode pose adjustment assembly, a photodiode clamping piece, a computer and a control device. When the performance of the laser diode needs to be detected, the laser diode is firstly clamped and fixed by the laser diode clamping piece, and the photodiode is clamped and fixed by the photodiode clamping piece; then, through the photodiode pose adjustment assembly, the distance between the photodiode and the laser diode is adjusted; then, through the laser diode pose adjustment assembly, the rotation angle of the laser diode is adjusted; and concurrently, the computer can receive light power signals of the laser diode detected and transmitted by the photodiode, information of the rotation angle of the laser diode is acquired through the control device, a corresponding curve is drawn, an offset angle and a divergence angle are obtained through a mapping algorithm, and the performance result of the laser diode is thus obtained.

Description

technical field [0001] The invention relates to the technical field of detection equipment, in particular to a detection equipment for detecting the performance of a laser diode. Background technique [0002] In the optoelectronic device industry, one of the key components is a semiconductor laser, which is also called a laser diode (LD, Laser Diode). When problems occur in optoelectronic devices, testing and analyzing the performance of semiconductor lasers can become the primary breakthrough point to solve the problem, and equipment for analyzing LD performance has also been developed. At present, most of the equipment for analyzing LD performance uses industrial CCD (charge-coupled device) for focus capture, and then uses complex algorithms to obtain analysis results. The cost of such equipment for analyzing LD performance is relatively high, which is not conducive to popularization and use. [0003] Therefore, it is necessary to provide a technical means to solve the ab...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/02G01M11/0207
Inventor 杨家安
Owner APAT OPTOELECTRONICS COMPONENTS
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