Device Performance Evaluation Method for Reliability Screening of Linear Array Detectors

Abstract

The invention discloses a device performance evaluation method used for reliability screening of linear-array detectors. Firstly, a detection device obtains the response ratio and noise data under certain radiation conditions, on one hand, standard radiation and the radiation deviation ratio are calculated through a radiation response temperature feature formula, and radiation inconsistency is calculated through standard radiation; on the other hand, the noise equivalent value is calculated, device performance parameters are further calculated, and finally, performance of the detectors after reliability screening is judged according to the device performance parameters. The detection device comprises a radiation source, an operational amplifier, an A / D converter, a controller, a serial interface driver and a computer. The method effectively solves the problem of device performance evaluation of the linear-array detectors in the reliability screening process, and digitized standards are put forward.

Description

technical field [0001] The invention relates to the use of a linear array detector for a linear array infrared earth sensor. In particular, it relates to a device performance evaluation method for reliability screening of linear array detectors. Background technique [0002] The infrared earth sensor is a satellite attitude optical sensor based on the principle of infrared radiation sensitivity of the earth. It can be used to measure the pitch and roll attitude angle signals of the spacecraft relative to the local vertical of the earth, and capture and capture the earth by the spacecraft in the initial state. The attitude control of the spacecraft during steady-state operation is of great importance in the aerospace field. The linear array infrared earth sensor is an important branch of its development, and its important part is the detector it chooses. Its accuracy and reliability largely depend on the performance parameters of the detector it chooses. Among them, in the ...

AI Technical Summary

Problems solved by technology

Existing detector performance evaluation schemes rely heavily on detection devices: some devices are complex and the measurement steps are cumbersome, and the performance evaluation after reliability screening is effective, but the whole process requires a lot of cost factors such as manpower and material resources; some devices are simple , but it is greatly affected by various factors such as environmental characteristics and device performance, which in turn affects the judgment of device performance after reliability screening

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