Low temperature surface photogrammetry method

A photogrammetry and surface shape technology, applied in measuring devices, instruments, optical devices, etc., can solve problems such as large measurement errors, and achieve the effect of eliminating systematic measurement errors

Active Publication Date: 2017-12-12
ZIJINSHAN ASTRONOMICAL OBSERVATORY CHINESE ACAD OF SCI +1
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0007] The technical problem to be solved by the present invention is that the existing measuring equipment and methods are either not enough to deal with the problem of real-time measurement of the deformation state of a single antenna panel in the low-temperature Antarctic field, or the problem of large measurement errors

Method used

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Embodiment Construction

[0013] The low-temperature surface photogrammetry method of the present invention comprises the following steps:

[0014] 1) The entire surface of the panel covers a number of measuring points and 8 groups of coded marks with a mutual interval of less than 2cm; each group of coded marks is formed by a combination of coded points with fixed mutual positions, and each group of coded marks is different. Stitching during post-calculation; the three-dimensional positions of the measurement points are combined to form the surface shape of the panel; both the coding points and the measurement points use reflective targets; since each group of coding marks is different, it can be performed accurately according to the sequence of the coding marks stitching;

[0015] 2) A temperature sensor and a scale are set on the rotating round platform, the signal output end of the temperature sensor is connected to the control computer of the peripheral device, and there is a reflective target at ...

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Abstract

The invention discloses a low-temperature surface shape photogrammetry method, which adopts a high-resolution industrial camera combined with an automatic test bench driven by a low-temperature motor to realize automatic shooting of measuring equipment in a low-temperature environment experiment cabin; As a result, the target thickness is calibrated, thereby eliminating systematic measurement errors caused by differences in target thickness. In the low-temperature environment experiment cabin, the present invention realizes the repeated measurement accuracy of 2.1 micron rms, and the measurement effect is ideal, and can measure the variation law of the surface shape of various plate structures in the temperature range from normal temperature to -60°C.

Description

technical field [0001] The invention relates to a method for low-temperature surface photogrammetry. Background technique [0002] The terahertz band between the radio and optical infrared bands is an important means of astronomical observation, especially suitable for studying dark energy, large-scale structure, first generation star formation, galaxy formation and evolution, formation and early evolution of stars and planetary systems, The physical and chemical properties of the atmosphere of extraterrestrial planetary systems and the origin of life in the universe are the most important frontier scientific issues in modern astronomy. [0003] At present, the ground-based terahertz observation equipment that has been built and is under construction in the world includes Atacama LargeMillimeter / submillimeter Array (ALMA) and Submillimeter Array (SMA). In addition, the terahertz telescopes under planning include the Cornell Caltech Atacama Telescope (CCAT) and the China Ant...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
Inventor 钱元娄铮刘昌儒范生宏王海仁左营喜杨戟
Owner ZIJINSHAN ASTRONOMICAL OBSERVATORY CHINESE ACAD OF SCI
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