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Flexible array eddy-current probe for detecting conductive structure defects and detection method

A conductive structure, flexible array technology, applied in the direction of measuring devices, material analysis by electromagnetic means, instruments, etc.

Inactive Publication Date: 2015-07-22
SHANGHAI MARITIME UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to overcome the deficiencies of the prior art and provide a flexible array eddy current probe device and detection method for detecting surface defects of complex metal conductive structures

Method used

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  • Flexible array eddy-current probe for detecting conductive structure defects and detection method
  • Flexible array eddy-current probe for detecting conductive structure defects and detection method
  • Flexible array eddy-current probe for detecting conductive structure defects and detection method

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Embodiment Construction

[0049] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0050] figure 1It is a top view of a flexible eddy current array probe 100 (hereinafter referred to as flexible probe or probe) provided by the present invention. The probe is provided with a plurality of coils 101 as excitation and sensing elements, and these coils 101 are grouped to form a plurality of coil assemblies ( figure 1 There are four coil assemblies in the example), so that each coil assembly contains one or more coils 101 .

[0051] A large number of coils 101 are distributed on the probe in the form of a planar array, and are used to detect complex surface shape defects of conductive structures. Preferably, it is hoped that the array of coils can cover as much surface of the probe as possible, but the present invention does not exclude the implementation structure that the array of coils only covers a part of the surface of the probe.

[0052...

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Abstract

The invention relates to a flexible array eddy-current probe for detecting conductive structure defects and a detection method. The flexible array eddy-current probe is characterized in that a plurality of coils arranged into a planar array in the radial direction or the circumferential direction are embedded in a flexible structure of the flexible array eddy-current probe; the flexible structure is adaptive to a three-dimensional surface of a detected part in shape, and the surface of the probe is in close contact with that of the detected part, so that the lift-off interference is reduced; according to set control logic, all the coils in a probe are excited in a time-sharing way, one or more coils adjacent to each excited coil is / are subjected to signal acquisition so as to obtain a defect signal at a corresponding position on the surface of the detected part; the excitation of each coil and the signal acquisition are a round robin in turn according to a space sequence and / or a time sequence so as to achieve the purposes of quickness and full coverage detection.

Description

technical field [0001] The invention relates to a nondestructive detection probe device and a detection method thereof, in particular to an eddy current flexible array probe and a detection method for detecting complex surface defects of metal components. Background technique [0002] Cracks or defects on the surface or subsurface of some critical and complex-shaped metal parts, such as engine blades and aircraft fuselages, may lead to engine failure or aircraft crash. In order to assess the structural safety of equipment, information such as the number, location and shape of defects such as cracks on the surface of complex metal structures is required. Various detection methods such as magnetic particle testing, penetrant testing, and magnetic flux leakage testing have been widely used in the detection of cracks and defects. However, methods such as magnetic particle testing and penetrant testing are not capable of quantitatively detecting defects, and cannot obtain defect...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/90G01N27/904
Inventor 张思全
Owner SHANGHAI MARITIME UNIVERSITY
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