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FPGA single-particle soft error impact evaluation method

A single-event, soft-error technology, applied in the field of integrated circuit radiation hardening design, which can solve problems such as failure to directly reflect the impact

Active Publication Date: 2015-03-25
BEIJING INST OF SPACECRAFT SYST ENG
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  • Summary
  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

This method fails to directly reflect the impact of single event soft errors on the SRAM FPGA itself
Therefore, using the traditional σ-LET curve method and the on-orbit single event soft error rate method to characterize the impact of single event soft errors on SRAM FPGAs has its own limitations.

Method used

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  • FPGA single-particle soft error impact evaluation method
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  • FPGA single-particle soft error impact evaluation method

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Experimental program
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Embodiment

[0061] The specific implementation manner of the present invention is described by taking Xilinx SRAM type FPGA XQVR300 as an example.

[0062] S1: Determine the internal unit used by the SRAM FPGA:

[0063] Virtex FPGA XQVR300 is a SRAM-type FPGA produced by Xilinx on a 0.22μm process line, allowing on-track reconfiguration. Configure the FPGA as a chain of 14 registers. At the same time, the input and output modules IOB, interconnection lines and switch matrix are adopted.

[0064] S2: Analyze the single event soft error failure mode of SRAM FPGA, and establish the single event soft error failure mode tree:

[0065] Since the failure modes of the input and output module IOB and the switch matrix belong to the function interruption failure mode, the two are combined into one internal unit in order to facilitate the calculation. Since the wiring resources are used in the interconnection and the switch matrix, together with the registers, it can be classified as a memory mod...

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Abstract

The invention discloses an FPGA single-particle soft error impact evaluation method. According to the FPGA single-particle soft error impact evaluation method, for the specific configuration of an SRAM type FPGA without protective measures, the design structure and the resource occupation amount of the SRAM type FPGA are comprehensively considered, the transmission probability of single-particle soft error faults of an internal unit of the FPGA can be obtained, and the overall impact of the single-particle soft errors on the SRAM type FPGA is obtained through analysis so that satellite electronic product designers can master the overall impact of the single-particle soft errors on the SRAM type FPGA, and the single-particle soft error resisting design of the SRAM type FPGA can be easily guided.

Description

technical field [0001] The invention relates to the field of anti-radiation hardening design of integrated circuits, in particular to a method for evaluating the overall impact of single-event soft errors on SRAM-type FPGAs based on failure modes. Background technique [0002] SRAM-type FPGA has been increasingly used in high-performance aerospace equipment, such as a key device for signal processing, due to its high integration, rich logic resources, and dynamic configurability. However, due to the existence of a large number of high-energy charged particles on the space orbit, such as protons and heavy ions, the high-energy charged particles interact with SRAM-type FPGAs, causing single-event soft errors such as circuit logic flips, transient pulse interference, and functional interruptions. The so-called single event soft error, as the name implies, is the type of single event effect that the action of a single high-energy particle does not cause physical damage to the de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/26
Inventor 郑玉展蔡震波张庆祥赵小宇
Owner BEIJING INST OF SPACECRAFT SYST ENG
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