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Device and method for detecting weak absorption of optical element

An optical element, weak absorption technology, applied in the direction of testing optical performance, etc., can solve the problems of low measurement results, low sensitivity of thermal lens, increase the complexity of system structure, etc., to achieve the effect of improving sensitivity and accuracy

Active Publication Date: 2015-03-25
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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Problems solved by technology

In photothermal detection, commonly used analog weak signal detection instruments are phase-locked analyzers and Boxcar integrators, which increase the complexity of the system structure
Moreover, although it uses continuous output probe light, it cannot eliminate the DC component in the probe light, the sensitivity of the thermal lens on the surface of the system is low, and the measurement results are also low

Method used

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  • Device and method for detecting weak absorption of optical element
  • Device and method for detecting weak absorption of optical element

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Embodiment Construction

[0031] Such as figure 1As shown, the device for detecting weak absorption of optical elements described in the present invention includes a pump laser 10, a nonlinear crystal 30, a dichroic mirror 11, a reflection structure, a first focusing mirror 12, a second focusing mirror 13, The filter element 22, the pinhole 21 and the photodetector 20, the pump laser 10 in the embodiment of the present invention is a Q-switched solid-state laser whose working substance is Nd:YAG. The nonlinear crystal 30 is arranged at the laser emitting end of the pump laser 10 for converting part of the pump laser light into frequency-doubled laser light. The dichroic mirror 11 and the nonlinear crystal 30 have an included angle, which is used to separate the frequency-doubled laser from the pump laser. In the embodiment of the present invention, the dichroic mirror 11 and the nonlinear crystal 30 The included angle is 45°. The first focusing mirror 12 is arranged between the dichroic mirror 11 and...

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Abstract

The invention relates to a device and method for detecting the weak absorption of an optical element. The device comprises a pump laser, a nonlinear crystal, a dichroscope, a reflecting structure, a first focusing lens, a second focusing lens, a filtering element, a pinhole and a photoelectric detector. The nonlinear crystal is arranged at the laser emitting end of the pump laser, and an included angle exists between the dichroscope and the nonlinear crystal. The reflecting structure is used for reflecting a frequency doubling laser emitted by the dichroscope to the surface of the optical element. The second focusing lens is used for focusing the frequency doubling laser emitted by the reflecting structure to the surface of the optical element. The filtering element and the pinhole are sequentially arranged between the optical element and the photoelectric detector. The device and method for detecting the weak absorption of the optical element can overcome the defect that due to the different phases of pump lasers and detection lasers, direct-current components affect test results in a traditional mode, and the device and method for detecting the weak absorption of the optical element are particularly suitable for measuring short-pulse pump lasers and greatly improve the sensitivity and the precision of weak absorption tests of the optical element.

Description

technical field [0001] The invention relates to the technical field of measuring the absorption rate of optical elements, in particular to a device and method for detecting weak absorption of optical elements. Background technique [0002] The development of high-energy lasers requires very high-quality optical films, and the weak absorption of light by optical films is one of the main factors that limit the development of high-energy lasers, and affects the optical quality of optical films, and will cause thermal deposition of laser light in the film . Especially under the action of high-power lasers, even a very weak absorption of optical thin films is enough to cause catastrophic destruction of thin-film components. The study found that part of the absorption that causes damage comes from the intrinsic absorption of the film, and to a greater extent it comes from the local extra strong absorption caused by impurities and defects in the optical film. Therefore, it is nec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 郝明明汪丽娜路国光黄云恩云飞岳龙
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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