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A method for measuring plant leaf area index based on lidar point cloud technology

A technology of leaf area index and area index, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of low efficiency of leaf index measurement and high environmental requirements, and achieve the effect of fast measurement speed and great application value

Active Publication Date: 2017-05-31
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology

[0006] The purpose of the present invention is to solve the defects of low leaf index measurement efficiency and high environmental requirements in the prior art, and provide a method for measuring plant leaf area index based on laser radar point cloud technology to solve the above problems

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  • A method for measuring plant leaf area index based on lidar point cloud technology
  • A method for measuring plant leaf area index based on lidar point cloud technology
  • A method for measuring plant leaf area index based on lidar point cloud technology

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Embodiment Construction

[0045] In order to have a further understanding and understanding of the structural features of the present invention and the achieved effects, the preferred embodiments and accompanying drawings are used for a detailed description, as follows:

[0046] Such as figure 1 Shown, a kind of plant leaf area index measuring method based on lidar point cloud technology of the present invention comprises the following steps:

[0047] The first step is to obtain the 3D laser point cloud data of the plant canopy. The two-dimensional laser radar and the mobile robot are used to scan along the side of the plant canopy to obtain the three-dimensional coordinates of each frame image and the three-dimensional coordinate information of the scanning target point. 2D lidar and mobile robot scan plants, such as figure 2As shown, each frame of image captured by it is a slice image of perspective scanning, which is not a frame image in daily video. Each frame of image (slice image) is stitched...

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Abstract

The invention relates to a plant leaf area index measurement method based on the laser radar point cloud technology. Compared with the prior art, the defects that the leaf area index measurement efficiency is low, and the environment requirement is high are overcome. The method comprises the following steps of obtaining three-dimensional laser point cloud data of a plant canopy, cutting the point cloud data, conducting point cloud picture classification inside the plant edge contour, calculating the half side plant volume Vhalf of each plant, counting the number of hit points, counting the proportion of breaking points, and utilizing inversion for working out leaf area indexes. According to the plant leaf area index measurement method, by means of the three-dimensional point cloud data generated through a ground laser radar measurement system, with the combination of the computer graphics technology, the leaf area indexes are obtained from point cloud pictures for calculating needed relevant parameters and conducting multiple linear regression treatment, and therefore the leaf area indexes are calculated.

Description

technical field [0001] The invention relates to the technical field of plant leaf area index measurement, in particular to a method for measuring plant leaf area index based on laser radar point cloud technology. Background technique [0002] Leaf area index refers to the ratio of the total area of ​​crop leaves on a piece of land to the land area. It is one of the key parameters in ecological research and has important theoretical and practical values. At present, most of the measurement methods of leaf index of trees are indirect methods, that is, using instruments and equipment to measure other parameters related to leaf area index, and then calculating leaf area index, rather than directly measuring according to the definition of leaf area index. For example, the patent No. is that the document CN200810166822 proposes to use the relevant parameters of statistical fallen leaves to obtain the leaf area index of large-area woodland, but this method cannot be counted in the ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/28
Inventor 牛润新李成平徐照胜刘路刘永博王杰陈慧
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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