New method for testing clamp effect in dual-port-removed network

Abstract

The invention discloses a new method for testing the clamp effect in a dual-port-removed network. According to the method, a whole clamp system is measured through a vector network analysis instrument, the chain shape scattering parameter of a tested piece is obtained by converting the S parameter into the chain shape scattering parameter and through network cascading and matrix operation, the chain shape scattering parameter is converted into the S parameter, and then the true value of the tested piece can be obtained. The measurement process of a non-standard connector device is effectively simplified, the S parameter of the de-embedded tested piece can be rapidly obtained in real time, and therefore the implementation difficulty and complex steps in a traditional method are avoided. In addition, when the method is adopted, no calibration piece of a non-standard connector needs to be manufactured, no complex and time-consuming modeling and simulation needs to be conducted, the method can be programmed to and embedded in the vector network analysis instrument, and therefore the measurement result can be rapidly displayed in real time, and large-scale production and testing are facilitated.

Description

technical field [0001] The present invention relates to a new method for removing test fixture effects in two-port networks. Background technique [0002] In the process of RF circuit design and measurement, when measuring non-standard connector devices, it is usually necessary to connect a fixture between the vector network analyzer and the device under test, which will cause the calibration end face (the connection between the fixture and the vector network analyzer) and The measurement end face (the connection between the fixture and the tested part) is not the same end face. To get the true value of the tested part, the effect of the fixture must be removed. There are usually two methods to remove the fixture effect: one is the calibration piece of custom non-standard connectors, which usually have open-short-load-through (SOLT calibration) and straight-reflection-transmission line (TRL calibration), directly on the measurement end face The other is to simulate the fixt...

AI Technical Summary

Problems solved by technology

However, the above two methods have the following disadvantages in practical application: first, it is very difficult to make and calibrate the calibration parts, and the index accuracy is difficult to meet the measurement requirements; The theoretical value will have considerable deviation, and the measurement results cannot be obtained in real time

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