Large-current transient state characteristic detection device of electronic current transformer

Abstract

The invention provides a large-current transient state characteristic detection device of an electronic current transformer. The large-current transient state characteristic detection device comprises a controller unit, a transformer, a direct-current charging power supply and waveform output units connected with an ECT test product. The waveform output units include a steady state waveform output unit and a transient state waveform output unit, the controller unit comprises a charging control module, a phase-selection switching-on control module, a waveform monitoring module and a waveform adjustment module, and the controller unit outputs signals for adjusting work states to electronic devices in the waveform output units so as to control the waveform output units to output steady state waveforms and transient state waveforms to the ECT test product. Compared with the prior art, the large-current transient state characteristic detection device of the electronic current transformer can accurately adjust current peak values and attenuation time constants of output transient state voltage waveforms and output transient state current waveforms, and accordingly detection requirements of electronic current transformer test products of different models are met.

Description

technical field [0001] The invention relates to a detection device for an electronic current transformer, in particular to a large current transient characteristic detection device for an electronic current transformer. Background technique [0002] The transient test of electronic current transformer includes direct method and equal ampere-turn method. The direct method is tested by a large-capacity current source with phase-selection closing function, and the test process needs to meet the time constant requirements of the primary circuit. Yet still do not possess at present the long-time current transformer high-current transient test facility; As when the rated current is 2kA, the symmetrical short-circuit current can not carry out the transient test to it when the symmetrical short-circuit current is 40kA, a large number of long-term observations, research findings by the inventor At present, there is no existing technology that can meet the requirements of the transie...

AI Technical Summary

Problems solved by technology

When the equal ampere-turn method is used for the equivalent error test, although the multi-turn primary wire is evenly distributed on the winding circumference, the magnetic field generated by it is uniform in segments as a whole, but the magnetic field near the coil plane of each turn is the strongest, causing its corresponding The local magnetic density of the iron core increases, and even local magnetic saturation occurs, the iron loss increases, and the primary excitation current increases, which eventually causes the error of the current transformer to deviate accordingly.

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