Photovoltaic system direct-current arc fault detection method, device, processor and system
A photovoltaic system and DC arc technology, applied in the monitoring of photovoltaic systems, photovoltaic power generation, measuring devices, etc., can solve the problems of easy misjudgment, inability to adapt to the operating environment of photovoltaic systems, and increased current noise, so as to improve detection accuracy Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0049] see figure 1 , Embodiment 1 of the present invention discloses a method for detecting a DC arc fault in a photovoltaic system to improve the detection accuracy of a DC arc fault in a photovoltaic system, including:
[0050] Step 101: Obtain the operating parameters of the photovoltaic system;
[0051] Step 102: Obtain the current noise signal in the DC cable of the photovoltaic system; the execution sequence between step 102 and step 101 is not limited, and this embodiment only provides one execution sequence;
[0052] Step 103: Adjusting a threshold according to the operating parameters, the threshold is used to judge whether the current noise signal has arc characteristics;
[0053] Step 104: Using the threshold value to judge whether the current noise signal has arc characteristics; when the current noise signal has arc characteristics, enter step 105, otherwise return to step 101;
[0054]Step 105: Send out a DC arc fault signal of the photovoltaic system.
[005...
example 1
[0072] The first criterion includes: counting the number of points whose amplitude is greater than a first threshold among the plurality of discrete frequency points; judging whether the number of points is greater than a second threshold, and when the number of points is greater than the second threshold, It is determined that the current noise signal has an arc characteristic. Correspondingly, see Figure 4 , using the photovoltaic system DC arc fault detection method of the first criterion, including:
[0073] Step 401: Obtain the operating parameters of the photovoltaic system;
[0074] Step 402: Obtain the current noise signal in the DC cable of the photovoltaic system;
[0075] Step 403: Adjusting a threshold according to the operating parameters, the threshold is used to judge whether the current noise signal has an arc characteristic;
[0076] Step 404: Calculate the frequency spectrum of a frequency segment according to the current noise signal to obtain a pluralit...
example 2
[0081] The second criterion includes: calculating the average amplitude of the multiple discrete frequency points; counting the number of points among the multiple discrete frequency points that meet the preset requirements, wherein the meeting the preset requirements refers to the The absolute value of the difference between the amplitude of the frequency points and the average amplitude is less than a third threshold; determine whether the number of points is greater than a fourth threshold, and when the number of points is greater than the fourth threshold, determine the current noise signal Has arcing characteristics. Correspondingly, see Figure 5 , using the second criterion for detecting DC arc faults in photovoltaic systems, including:
[0082] Step 501: Obtain the operating parameters of the photovoltaic system;
[0083] Step 502: Obtain the current noise signal in the DC cable of the photovoltaic system;
[0084] Step 503: Adjusting a threshold according to the op...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com