Automatic testing device of frequency devices and testing method thereof

Abstract

The invention discloses an automatic testing device of frequency devices. The automatic testing device comprises a computer, an integrated control unit, a frequency meter and at least one high-low temperature chamber. The integrated control unit comprises a core central processing unit (CPU), and the core CPU is in interactive communication with the computer. The high-low temperature chamber is provided with a high-low temperature control unit, and a plurality of selecting testing units are arranged inside the high-low temperature chamber. The selecting testing units comprise a plurality of sets of testing stations. Each set of testing station comprises a 4514 decoder, a plurality of gating switches and a plurality of device bases. A plurality of output ends of the 4514 decoder are respectively connected at control ends of the plurality of gating switches, output ends of the plurality of device bases are respectively connected with input ends of the plurality of gating switches, output ends of the plurality of gating switches are mutually connected and then are connected to an input end of the frequency meter, and the frequency meter sends a tested result to the computer in an electrical signal mode through the core CPU. The automatic testing device of the frequency devices has the advantages of achieving automated testing and being time-saving, labor-saving and high in production efficiency.

Description

technical field [0001] The invention relates to the technical field of frequency device testing, in particular to an automatic frequency device testing device and a testing method thereof. Background technique [0002] During the production process of frequency devices, it takes a lot of time to conduct high and low temperature environmental tests, and it is necessary to collect frequency data of frequency devices in real time. In the traditional production process, manual testing is generally used to complete the collection of high and low temperature test data. The process is divided into: turn on the power of the product, set the temperature of the incubator, wait for the constant temperature, turn on the frequency meter, switch the frequency devices one by one, test the frequency The output frequency of the device and record it. In the above-mentioned process, since the method of manual testing is adopted, the whole process is extremely cumbersome, and has the defects o...

AI Technical Summary

Problems solved by technology

In the above process, due to the use of manual testing, the whole process is extremely cumbersome, and has the defects of labor-intensive, time-consuming, and low efficiency.

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