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Analytical testing system based on VI data acquisition equipment

A data acquisition equipment, analysis and testing technology, applied in the transmission system, electromagnetic wave transmission system, electrical components, etc., can solve the problems of easy operator error, poor efficiency, long time required for data collection and analysis, etc., to improve efficiency, data Flexible acquisition and reliable data analysis

Inactive Publication Date: 2013-04-03
科纳技术(苏州)有限公司
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Problems solved by technology

[0003] However, at present, the general data storage of optical test equipment is completed through mobile devices, and data analysis also requires the use of statistical software. It is rare to complete conventional data acquisition and analysis with one-click data acquisition cards, and traditional data acquisition and analysis requires Long time, poor efficiency, easy to make mistakes in personnel operation

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  • Analytical testing system based on VI data acquisition equipment
  • Analytical testing system based on VI data acquisition equipment
  • Analytical testing system based on VI data acquisition equipment

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Embodiment Construction

[0015] The invention proposes an analysis and testing system based on VI data acquisition equipment, which is based on the NI data acquisition card, and can flexibly take out, flexibly analyze, display and automatically store the test parameters of the optical vector analyzer. The invention has strong flexibility, simple operation and fast speed, can reduce the complexity of data collection and analysis, and can be applied to data analysis in the field of data collection of various optical communication enterprises. The analysis and test system includes a NI data acquisition card 1; an optical vector analyzer 2; an optical passive device to be tested 3; and a data analysis computer 4. The implementation of the analysis and testing system based on VI data acquisition equipment will be described in detail below.

[0016] The operation interface of the analysis and test system based on VI data acquisition equipment is as follows: figure 2 As shown, its operation method is as fo...

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Abstract

The invention relates to a data acquisition and analytical testing system, in particular relates to an analytical testing system based on VI data acquisition equipment. According to the system, IL and PDL of an optical passive device are measured through a light vector analyzer, the data result is automatically acquired through an NI data acquisition card, the testing result is automatically analyzed and displayed through data analysis of the program programmed by Labview in a computer, and the testing source data and the data analysis result are automatically saved. The system can replace the conventional method, the mobile equipment storage and a large amount of statistical work completed by the application of Excel and other software, greatly improves the efficiency and the accuracy of the data acquisition and data analysis operation, and can be widely applied to data analysis and storage in the field of data acquisition in various optical communication enterprises.

Description

technical field [0001] The present invention relates to a data acquisition and analysis test system, in particular to an analysis and test system based on VI data acquisition equipment, which automatically collects and automatically analyzes the test results of the optical vector analyzer through a data acquisition card, and has the advantages of low cost, data acquisition The sum analysis method is simple and fast, and can be widely used in data analysis and storage in the data collection field of various optical communication enterprises. Background technique [0002] At present, the data acquisition of optical measurement equipment has become the development trend of optical measurement, and the recording and analysis of measurement results require a lot of work. The analysis and testing system based on VI data acquisition equipment can automatically convert the IL and PDL test results of the optical vector analyzer Do arbitrary collection, complete routine data analysis,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/079H04B10/071
Inventor 赵利刚刘华袁海骥
Owner 科纳技术(苏州)有限公司
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