Method for evaluating voltage dip sensitivity of sensitive equipment

Abstract

The invention discloses a method for evaluating voltage dip sensitivity of sensitive equipment, belonging to the field of electric measurement. A voltage dip frequency of a power grid in a time section and depth and duration time of each voltage dip are monitored at a measurement point so as to establish a small sample set of practical voltage dips of the power grid in the time section, and a final evaluation result depends on equipment fault rate caused by measuring the voltage dip each time, so that influence degree of running conditions of the power grid in the time section on the sensitive equipment is really reflected, and influence of the voltage dips caused by various short-circuit faults in the power grids with different structures on the sensitive equipment can be reflected, so that related departments is guided to take more reasonable control measures or providing a basis for calculating economic loss caused by the voltage dips. Therefore, the method can be widely applied to the field of power supply quality control and management of the power grid.

Description

technical field [0001] The invention belongs to the field of electric variable measurement, and in particular relates to a method for detecting the severity of the impact of voltage sag events on sensitive equipment. Background technique [0002] Since the 1980s, the power quality problem has gradually become a focus of research and attention. On the one hand, the power load in the modern power system has undergone significant changes, and the widespread use of non-linear, impactful or asymmetrical loads has caused a large number of power quality problems; on the other hand, with the development of the national economy and science and technology , Microelectronic devices and power electronics technology are widely used, and the requirements for power quality are getting higher and higher. [0003] With the development of high-tech industries, modern industrial enterprises use a large number of sensitive equipment such as programmable logic controllers (PLC), adjustable spee...

AI Technical Summary

Problems solved by technology

It is based on the ITIC and CBEMA curves to obtain the voltage sag tolerance difference of a single sag event, and then calculate the mean value and standard deviation of the voltage sag tolerance difference combined with the annual sag frequency, and calculate the voltage based on the mean value and variance The index of sag intensity; the meaning of the ITIC or CBEMA curve itself is that when the tolerance of sensitive equipment reaches the level of the ITIC or CBEMA standard curve, a certain probability of failure can be avoided; however, in actual operation and management, different types of equipment or There are obvious uncertainties in the degree to which different types of equipment of the same type are affected by voltage sags. The tolerance of most sensitive equipment cannot reach the level of the ITIC or CBEMA standard curve without special measures, so directly There are often large deviations or differences between the evaluation results using the ITIC and CBEMA standard curves and the actual operating conditions of the actual equipment

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