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Improved window Fourier three-dimensional measurement method based on Stockwell transform

A three-dimensional measurement and window technology, which is applied to measurement devices, instruments, and optical devices, etc., can solve the problems of slow speed, inaccurate phase determination in the jump region, and large error in determining the size of the window.

Inactive Publication Date: 2012-08-01
SOUTHEAST UNIV
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Problems solved by technology

[0007] Technical problem: Aiming at the problem that the wavelet transform is slow in obtaining the size of the window Fourier window and the error in obtaining the window size is large in height jumps and steep areas, the purpose of the present invention is not to affect the accuracy of the window size. , to solve the problem of inaccurate phase calculation in the jump region, and provide an improved window Fourier three-dimensional measurement method based on Stockwell transform

Method used

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  • Improved window Fourier three-dimensional measurement method based on Stockwell transform
  • Improved window Fourier three-dimensional measurement method based on Stockwell transform
  • Improved window Fourier three-dimensional measurement method based on Stockwell transform

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Embodiment Construction

[0067] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings. Using VC++6.0 as a programming tool under the windows operating system, the black and white deformed fringe images collected by CCD are processed. In this example, a plastic shield is used as the measured object, and finally a more accurate full-field absolute phase distribution containing three-dimensional information of the shield is obtained.

[0068] figure 1 It is a flowchart of the whole process of the present invention.

[0069] figure 2 It is a specific flow chart of the process of unwrapping the phase in step 5 of the present invention.

[0070] Aiming at the problem of inaccurate phase resolution in areas with severe height jumps by the three-dimensional measurement method based on wavelet transform, the present invention uses the Stockwell transform method (i.e., S transform) to obtain the window scale factor, and utilizes its s...

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Abstract

The invention relates to a new improved three-dimensional measurement method based on Stockwell transform. The invention mainly aims at precisely solving the phase distribution of a stripe image and getting three-dimensional appearance information of an object by the phase distribution. The implementation steps are as follows: projecting a black and white sine stripe image on the measured object; performing the Stockwell transform on the deformation stripe image which is collected by a CCD (charge coupled device) line by line, extracting a Stockwell transform ridge, then figuring out and removing errors caused by phase two-order derivation during the process of seeking the ridge, and finally getting a precise window size matrix; substituting the precise window matrix into a window Fourier transform, and calculating relative phase information of a deformation stripe pattern through filtration and other steps; establishing a quality map of the stripe pattern, then performing phase unwrapping by adopting a flood fill algorithm, and getting the absolute phase distribution of the stripe image; and getting the three-dimensional information of the measured object by the absolute phase distribution according to a phase-to-height conversion formula.

Description

technical field [0001] The invention belongs to the technical field of three-dimensional information reconstruction, and uses fringe projection profilometry for three-dimensional measurement of objects based on modulation grating projection, combined with Stockwell transformation and window Fourier transformation method. The whole system involves the design of black and white projected grating fringes, calculation of window size, phase calculation and other parts. Background technique [0002] Three-dimensional measurement based on optical projection is widely used in product inspection and processing control, medical field, cultural relic protection field, aerospace field, cultural field, etc. Among many 3D measurement technologies, optical 3D measurement technology has become the dominant 3D measurement technology due to its non-contact measurement and good real-time performance. [0003] Optical three-dimensional measurement technology is a modern measurement technology ...

Claims

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Application Information

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IPC IPC(8): G01B11/25
Inventor 达飞鹏董富强陈璋雯
Owner SOUTHEAST UNIV
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