Phase compensating method in object surface outline measurement
A technology of object surface and phase compensation, applied in the field of phase compensation, can solve the problems of random noise of phase distribution, and achieve the effect of low dependence, high robustness, and improved accuracy
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[0038] Example: For object surface profile measurement systems using different structured light technologies, such as
[0039] 1) Phase shift method;
[0040] 2) Gray code + phase shift method;
[0041] 3) Single structured light grating method.
[0042] As long as the measurement system adopts digital equipment, including digital projectors and digital cameras, as tools for projecting structured light and collecting images, and adopts sinusoidal grating as the projection grating, the measurement system has system errors caused by gamma nonlinearity. The present invention can be used for the phase compensation of the above-mentioned object surface profile measurement system, and the specific embodiments are slightly different.
[0043] 1. Object surface profile measurement system based on phase shift method.
[0044] For the phase shift method using sinusoidal gratings of different frequencies, in the process of phase compensation and function creation, such as figure 1 The sinusoidal ...
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