System and method for analyzing scattering parameter passivity
A technology for scattering parameters and analysis systems, which is applied in the field of passive analysis systems for scattering parameters, and can solve problems such as the inability of simulation software to converge.
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[0017] refer to figure 1 Shown is an application environment diagram of a preferred embodiment of a scattering parameter (scattering parameters, S-parameter for short) passivity analysis system 31 (hereinafter referred to as the system 31 ) of the present invention. The system 31 is applied to a computing device 30 . The computing device 30 also includes a processor 33 and a memory 34 . Such as figure 1 As shown, the computing device 30 is connected to the measuring instrument 20, and the measuring instrument 20 is used to measure the signal transmitted on the circuit 10 to obtain a scattering parameter (scattering parameters, referred to as S parameter) file 32, and the S parameter File 32 is stored in memory 34 .
[0018] The system 31 is used to generate a rational function matrix of S parameters for the S parameter file 32, convert the rational function matrix of S parameters into a state space matrix, and bring the state space matrix into the Hamiltonian matrix for ana...
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