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System and method for analyzing scattering parameter passivity

A scattering parameter and analysis system technology, applied in the field of scattering parameter passivity analysis system, can solve the problem that the simulation software cannot achieve convergence

Active Publication Date: 2014-08-20
泰州市智谷软件园有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the equivalent circuit model does not satisfy the passivity, it will cause the problem that the simulation software cannot achieve convergence in the time domain solution process

Method used

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  • System and method for analyzing scattering parameter passivity
  • System and method for analyzing scattering parameter passivity
  • System and method for analyzing scattering parameter passivity

Examples

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Embodiment Construction

[0017] refer to figure 1 Shown is an application environment diagram of a preferred embodiment of a scattering parameter (scattering parameters, S-parameter for short) passivity analysis system 31 (hereinafter referred to as the system 31 ) of the present invention. The system 31 is applied to a computing device 30 . The computing device 30 also includes a processor 33 and a memory 34 . Such as figure 1 As shown, the computing device 30 is connected to the measuring instrument 20, and the measuring instrument 20 is used to measure the signal transmitted on the circuit 10 to obtain a scattering parameter (scattering parameters, referred to as S parameter) file 32, and the S parameter File 32 is stored in memory 34 .

[0018] The system 31 is used to generate a rational function matrix of S parameters for the S parameter file 32, convert the rational function matrix of S parameters into a state space matrix, and bring the state space matrix into the Hamiltonian matrix for ana...

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Abstract

The invention provides a system and a method for analyzing scattering parameter passivity, which can be applied to a calculating device. The calculating device is connected with a measuring instrument which is used for measuring a signal transmitted on a circuit to obtain a scattering parameter file. The system comprises a parameter reading module, a vector fitting module, a matrix conversion module and a passivity analysis module, wherein the system reads the scattering parameter file by the modules; each scattering parameter is respectively subjected to vector fitting to generate a non-common extreme-value form rational function matrix of the scattering parameter; according to the rational function matrix, an equivalent circuit is generated, and the rational function matrix is converted into a state space matrix; finally, the state space matrix obtained by conversion is substituted into a Hamilton matrix by the system; and whether the characteristic value of the Hamilton matrix comprises a pure imaginary numerical value is analyzed to judge whether the rational function matrix satisfies the passivity or not so as to judge whether the equivalent circuit satisfies the passivity requirement or not.

Description

technical field [0001] The invention relates to a circuit simulation system and method, in particular to a scattering parameter passivity analysis system and method. Background technique [0002] In low frequency circuits, the size of electronic components such as transmission lines is negligible relative to the wavelength of the signal. However, in high-frequency microwave circuits, due to the short wavelength, the size of electronic components cannot be ignored. The microwave network method equates the microwave components to reactance or resistance devices, and equates the actual guided wave transmission system to a transmission line, thus simplifying the actual microwave system into a microwave network. Electronic components that cannot generate power, such as reactance and resistors, are called passive electronic components, and circuits that include only passive electronic components are called passive circuits. [0003] Scattering parameters (scattering parameters, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G06F17/50
Inventor 曾文亮李昇军许寿国
Owner 泰州市智谷软件园有限公司
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