Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for testing multi-mode apparatus

A test method and test system technology, applied in the field of computer applications and integrated circuit equipment manufacturing, can solve the problems of long development cycle, high R&D cost of integrated circuit manufacturing equipment, failure to predict failures, etc.

Inactive Publication Date: 2011-09-07
TSINGHUA UNIV
View PDF4 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, limited by the test conditions, it is impossible to predict possible failures in advance
Therefore, there are problems of high R&D cost and long development cycle of integrated circuit manufacturing equipment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for testing multi-mode apparatus
  • Method and system for testing multi-mode apparatus
  • Method and system for testing multi-mode apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0046] The multi-mode instrument testing method and system provided by the embodiment of the present invention are implemented on the Windows XP operating system, based on .NET Framework 3.5, and using Visual C# technology. The exclusive control of the data acquisition card is realized by setting the running flag for the test project, wherein the test project includes two types: instrument test project and equipment test project. Through the exclusive control of the data acquisition card, it is ensured within each test project and betwee...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for testing a multi-mode apparatus. The method comprises the following steps of: loading a plurality of pieces of testing engineering, wherein the plurality of pieces of the testing engineering comprises apparatus testing engineering and equipment testing engineering; setting running identifiers for the apparatus testing engineering and the equipment testing engineering, performing monopolistic control on a data acquisition card by adjusting the running identifiers, and occupying the data acquisition card in different time sharing by the apparatus testing engineering and the equipment testing engineering; detecting a communication type of an apparatus to be tested or equipment to be tested, and initializing the corresponding data acquisition cards respectively according to the communication type; and running the plurality of pieces of testing engineering in a preset command mode by the data acquisition card. In the invention, the monopolistic requirement on the data acquisition card and communication network using is met during testing of the different apparatuses to be tested or in the different testing engineering by setting the running identifiers, and test on a plurality of characteristics, such as an apparatus execution instruction, time delay, a continuous execution instruction and the like is realized at the same time. The invention also discloses a system for testing the multi-mode apparatus.

Description

technical field [0001] The invention relates to the field of computer application technology and the field of integrated circuit equipment manufacturing, in particular to a multi-mode instrument testing method and system. Background technique [0002] With the continuous improvement of the integration level of integrated circuit chips and the continuous improvement of chip functions, users have higher and higher requirements for technology. However, many problems are faced in the research and development of integrated circuit manufacturing equipment. For example, in the research and development of integrated circuit equipment, there is not only the research and development of the hardware part, but also the research and development of the control software system for the equipment. In order to ensure the normal operation of the instrument, the instrument test is a process that must be completed before the instrument is installed in the specific equipment. After the hardware...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01D21/00G05B19/02
Inventor 田凌苏孝钐刘敏黄利平
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com