Method for obtaining a structure factor of an amorphous material, in particular amorphous glass

A technology of amorphous materials and structure factors, applied in the direction of using wave/particle radiation for material analysis, analyzing materials, measuring devices, etc., can solve problems such as difficult to identify mathematical artifacts

Inactive Publication Date: 2011-08-03
原子能和辅助替代能源委员会
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Problems solved by technology

[0013] - On the other hand, the calculation of the radial distribution function by Fourier transform encounters a spectral truncation effect in the high value range of the modulus of the scattering vector, introducing mathematical artifacts that are subsequently difficult to identify

Method used

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  • Method for obtaining a structure factor of an amorphous material, in particular amorphous glass
  • Method for obtaining a structure factor of an amorphous material, in particular amorphous glass
  • Method for obtaining a structure factor of an amorphous material, in particular amorphous glass

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Embodiment Construction

[0022] figure 1 Example The principle of X-ray scattering used in the method according to the invention. An incident beam 1 of X-photons emitted by a source 11 towards a glass sample 11 is backscattered or reflected by the glass sample.

[0023] A glass sample 10 is placed on the diffractometer 3 . The presence or absence of a post-monochromator can be considered in the configuration of the diffractometer.

[0024] Incident X-rays 1 are reflected by the glass. figure 1 The ray 2 reflected by the sample 10 is depicted. The detector 12 is arranged in the direction of propagation of the reflected ray 2 . This detector 12 makes it possible in particular to measure the intensity of the reflected photons.

[0025] In methods of the WAXS type, the angle of incidence of the emitted X-rays 1 is varied over a relatively large angular range such that the scattering angle θ is varied over a relatively large angular range. The intensity of the reflected photons then varies as a funct...

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Abstract

According to the invention, an incident X-ray is transmitted in a wide angular sector towards a sample of amorphous material that scatters back the X-rays. The method comprises: a step of storing experimental photonic intensity measures based on the incidence angle; a step of correcting the experimental intensity while taking into account at least the absorption phenomena within the sample based on the penetration length l of the incident wave inside the sample before reflection; a standardisation step of reporting the corrected intensity resulting from the experimental intensity to an electronic intensity according to a standardisation coefficient (Alpha); a step of calculating a discretised function Q.i ( Q ), i being a reduced intensity resulting from the measures of the corrected and standardised experimental intensity and Q being the module of the wave scattering vector proportional to the value sin Theta / Lambda, 2Theta being the scattering angle and Lambda being the length of the transmitted wave, the standardisation constant (Alpha) recursively varying in order to minimise the slope of the affine straight line (42) obtained by linear regression of the values of the function Q.i ( Q ), the reduced intensity values being calculated upon each iteration for a penetration length l, and the sought (41) function Qi ( Q ) corresponding to the minimum slope; and a step of determining the structure factor from the distribution of the radial atomic concentration Rho(r) based on Qi ( Q ).

Description

technical field [0001] The present invention relates to a method for obtaining the structure factor of amorphous materials. This material is, for example, amorphous glass. The invention is particularly suitable for determining the structural factor of glasses used to protect radioactive elements in order to study the development of this factor under the influence of accumulated radioactivity. Background technique [0002] Storage of radioactive elements must meet very strict ongoing safety and reliability standards. In particular, protection with respect to the external environment must remain effective for decades, or indeed centuries. Radioactive waste is classified according to several classes. The most sensitive radioactive materials, that is to say those exhibiting the highest radioactivity, are stored in amorphous glass, which is a neutral material from a radioactive point of view and thus forms a barrier to the spread of radioactivity. In effect, the radioactive w...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/205G01N23/207
CPCG01N23/207G01N23/205
Inventor O·布蒂
Owner 原子能和辅助替代能源委员会
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