Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for realizing microprogrammed control unit (MCU) verification platform based on verification methodology of verification methodology manual (VMM)

A verification methodology and verification platform technology, applied in the verification test field of 8-bit MCU, can solve problems such as low efficiency, lack of quantitative indicators, and verification quality cannot be guaranteed, and achieve the effect of saving verification time

Inactive Publication Date: 2014-02-19
SHANGHAI HUAHONG INTEGRATED CIRCUIT
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Usually the verification MCU will read the application program into the ROM, and confirm the correct function by observing the waveform and output through simulation; each time only a part of the corresponding MCU function can be tested according to the actual application program, and there is a lack of a quantitative indicator; and each time the MCU is changed, it needs Re-check the results, the efficiency is relatively low, and the verification quality cannot be guaranteed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for realizing microprogrammed control unit (MCU) verification platform based on verification methodology of verification methodology manual (VMM)
  • Method for realizing microprogrammed control unit (MCU) verification platform based on verification methodology of verification methodology manual (VMM)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] With SystemVerilog becoming the P1800 specification of the IEEE (Institute of Electrical and Electronics Engineers), more and more projects have begun to adopt SystemVerilog-based verification methodologies to obtain more reuse scalability, more comprehensive functional coverage, and more reasonable Hierarchical validation structure.

[0019] As the complexity of the design continues to increase, more resources need to be put into the verification. Not only the verification is required to cover all functions, but also a large number of abnormal conditions are expected to check the abnormal processing status of the module to be verified. Under traditional testing methods, the above requirements are often difficult to achieve. In addition, the design is constantly reused, and the verification also hopes to reuse similar verification modules, which leads to a hierarchical verification method. VMM verification methodology provides a verification method based on SystemVeril...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for realizing a microprogrammed control unit (MCU) verification platform based on the verification methodology of a verification methodology manual (VMM). The method comprises the following steps of: inputting all usable application program codes or generating a constraint random instruction by using the platform; realizing a model C of an MCU and providing values of all memory units and special function registers, and calling through a direct program interface (DPI); automatically performing self-checking according to a memory unit model serving as a reference; and describing various functional coverage models and providing a functional coverage result. By the method, a portable, reusable, extensible and fully automatic check MCU verification platform with a hierarchical structure can be established.

Description

technical field [0001] The invention relates to a verification test method of an 8-bit MCU (microcontroller), in particular to a method for realizing an MCU verification platform based on VMM (Verification Methodology Manual) which can automatically and efficiently verify the MCU strictly. Background technique [0002] With the MCU as the core of the chip, the functional correctness of the MCU is often crucial. In particular, each redesigned or modified MCU needs to undergo a large number of regression tests, and even multiple tapes out before it can actually be used in the project. Therefore, the verification of MCU usually requires a lot of time and human input. [0003] Usually, the verification MCU will read the application program into the ROM, and confirm the correct function by observing the waveform and output through simulation; each time, only a part of the corresponding MCU function can be tested according to the actual application program, lacking a quantitative ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 朱思良
Owner SHANGHAI HUAHONG INTEGRATED CIRCUIT
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com