Analyzing system of technical level of patent applicant

Abstract

The invention relates to an analyzing system of a technical level of a patent applicant, which comprises an applicant information extracting module, a technical information counting module, a technical level computing module and a technical level display module, wherein the technical information counting module comprises a technical information statistic table unit for counting each item of information obtained by the applicant information extracting module; the technical level computing module at least comprises a technology independence computing unit, a research and development capability computing unit, an emphasis technology analyzing unit and a technology potential computing unit and is used for reading the contents of the technical information counting module and computing each value of the technical level of the applicant according to a statistic result of the technical information counting module; and the technical level display module is used for displaying the technical level of the applicant according to the contents of the technical information counting module and the technical level computing module. The system has the advantages of discovering related information of the applicant deeply, comprehensively and thoroughly analyzing the technical level of the applicant, and simultaneously displaying the result in a more visual and easier mode.

Description

technical field [0001] The invention relates to a patent analysis system, in particular to a patent applicant's technical level analysis system. Background technique [0002] The analysis of the applicant's patent technical level is an important content in the patent analysis system, and it is also the focus of many companies' patent analysis. The analysis of the technical level of the applicant plays a vital role in in-depth understanding of the technological development trend, technological investment, technological research and development level, and key technological conditions of major competitors in the industry. [0003] The usual patent analysis work is generally just to list some information of the applicant, such as the number of patents of the applicant, the number of citations of the applicant's patents, the number of patent families, etc. These are just some of the most primitive data, which are complex and disorderly, and cannot intuitively show the technical ...

AI Technical Summary

Problems solved by technology

These are just some of the most primitive data, complex and disorderly, unable to intuitively show the technical level of the applicant, often people still don't know why after reading it

At the same time, due to the lack of in-depth processing and mining of these data, it is impossible to use these data to display more information

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