Strain measurement method based on light transmission measuring technology and device thereof

A technology of strain measurement and through measurement, which is applied in the mechanical field, can solve the problems that are not suitable for fast and convenient measurement, and achieve the effect of fast and convenient measurement and make up for blind spots

Inactive Publication Date: 2011-02-16
NORTHWESTERN POLYTECHNICAL UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to solve the technical problem that existing methods are not suitable for fast and convenient measurement of strain in small test area materials, flexible materials and large deformation conditions, the present invention proposes a strain measurement method and its device based on light transmission measurement technology

Method used

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  • Strain measurement method based on light transmission measuring technology and device thereof
  • Strain measurement method based on light transmission measuring technology and device thereof
  • Strain measurement method based on light transmission measuring technology and device thereof

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Embodiment Construction

[0022] The present invention is specifically described below in conjunction with embodiment:

[0023] Refer to attached figure 1 , attached figure 2 And attached image 3 , the strain measuring device based on the light transmission measurement technology of the present invention comprises a metal test stand 1 and a light transmission digital micrometer 2, and the metal test stand 1 is fixed on the testing machine platform 5 through the clamping hole 10 at the bottom; the metal test stand 1 There are two micrometer placement grooves 6 on the upper part, and a symmetrical mark 7 is between the two micrometer placement grooves 6, and there is a centering groove 8 above the symmetrical mark 7, and the centering groove 8 coincides with the longitudinal central axis of the symmetrical mark 7; The light-transmitting digital micrometer 2 is placed in the micrometer placement groove 6, and is closely attached to the symmetrical mark 7, and the light-transmitting digital micrometer ...

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Abstract

The invention provides a strain measurement method based on a light transmission measuring technology and a device thereof. The method is characterized by comprising the following steps: fixing two parallel rigid pins at both sides of a sample test section, wherein each rigid pin is perpendicular to the central axis in the stretching direction of the sample test section, and the length of each rigid pin is greater than the width of the sample test section; using a light transmission type digital micrometer to measure the initial distance between the two rigid pins, the real-time distance between the two rigid pins in the stretching process and the ultimate distance between the two rigid pins after the stretching operation; and calculating to obtain the real-time strain and the ultimate strain of the sample test section, wherein the measuring points of the micrometer are positioned at both sides of the sample test section and have the equal distance with the central axis in the stretching direction of the sample test section. By using the light transmission measuring technology to measure changes in the distance between the rigid pins in the stretching process, the invention realizes fast and convenient strain measurement of small-test area materials, flexible materials and large-deformation conditions. Besides, the invention overcomes the defects of the traditional measurement methods and well makes up the blind area of the application of various methods.

Description

technical field [0001] The invention belongs to a strain measurement method and a measurement device in the mechanical field, in particular to a strain measurement method and a device based on light transmission measurement technology. Background technique [0002] At present, the strain measurement methods in the mechanical field mainly include the resistance strain method, the use of mechanical electronic extensometers, and the use of laser holographic interferometry and so on. However, due to the influence of the area of ​​the strain gauge itself, the resistance strain method is often not suitable for measuring samples with a small surface area, and the strain gauge itself has strength limitations. When large deformation measurements are required, the resistance strain method is often not suitable. Not applicable; while using a mechanical electronic extensometer, it needs to be clamped on the sample. It is not applicable if the measured surface is too small or too large, ...

Claims

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Application Information

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IPC IPC(8): G01B11/16
Inventor 姚磊江郑翔童小燕曾垂宽赵凯胡国镇魏佩佳
Owner NORTHWESTERN POLYTECHNICAL UNIV
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