Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Fast measuring method of right angle of large-sized rectangular glass substrate and measuring instrument thereof

A glass substrate, large-scale technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of high cost, measurement errors, scrapped glass substrates, etc., to achieve high efficiency and simple operation, convenient observation and reading, convenient and fast cost. Effect

Inactive Publication Date: 2010-11-17
TUNGHSU GRP
View PDF0 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In the inspection of the right angle of traditional glass production and cutting, the comparison method is mainly used, that is, a square with the specified accuracy and the same size as the glass is used for close comparison. First, because the glass substrate is large and thin, it is difficult to handle, and it is slightly careless glass will shatter
Second, when the glass substrate is placed on the platform, there will be scratches on the glass surface, which will cause the inspected glass substrate to be scrapped
Third, due to the troublesome operation of the comparison method, there will be measurement errors if you are not careful, resulting in wrong results and misleading production
Recently, high-precision measurement equipment such as laser alignment systems have also appeared on the market, but due to their high cost, they are not suitable for glass substrate inspection.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fast measuring method of right angle of large-sized rectangular glass substrate and measuring instrument thereof
  • Fast measuring method of right angle of large-sized rectangular glass substrate and measuring instrument thereof
  • Fast measuring method of right angle of large-sized rectangular glass substrate and measuring instrument thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] as attached figure 1 The inventive method shown is:

[0027] First, when measuring, place one side of the glass substrate directly on the two positioning columns set at the bottom, and make the left edge of the glass close to the positioning column set on the left side. At this time, the displacement of this side is measured by a displacement detector. Data d1 (mm), the reference point of the displacement detector is set at 1000mm vertically above the left positioning column;

[0028] Then, turn the large-size glass over 180°, that is, turn the glass over, and measure the corresponding side of the first measurement side through the displacement detector. The measured value is d2 (mm), and finally calculate: the absolute value of (d2-d1) 1 / 2 of is the right angle measurement data of the large-size glass substrate.

[0029] as attached figure 2 , 3The measuring instrument for the right angle rapid measurement of the large-size glass substrate of the present invention...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for measuring the right angle of a large-sized rectangular glass substrate by utilizing a plane geometry principle and a linear displacement sensor and singlechip technology and measuring the displacements of two parallel edges of glass as well as a measuring instrument thereof. The accurate positioning of the glass substrate is realized by utilizing upper buses of two positioning columns positioned at the bottom of equipment and a side bus of a positioning column positioned at the left side of the equipment as standards; a part to be measured of the left side surface of the glass substrate stresses a mandril of the measuring instrument to generate the displacement; if the bottom edge of the glass substrate is not perpendicular to the side edge of the glass substrate, the reading value of the measuring instrument can be different by overturning the glass substrate by the displacement of 180 degrees, and a half of a difference value is right angle measuring data. The invention can fast and conveniently measure whether the right angle of the adjacent edges of the glass is in a range of 1 / 1000 or not; and in addition, the measuring method can realize the fast, efficient and easy operation in the production of the large-sized rectangular glass substrate, is convenient and fast, is lower in cost and better meets the requirements for the flow operation of a glass production line.

Description

technical field [0001] The invention relates to a method for measuring the right angle of a large-sized rectangular glass substrate by measuring the displacement of two parallel sides of the glass by using the principle of plane geometry, a linear displacement sensor and a single-chip microcomputer technology and a measuring instrument thereof. Background technique [0002] At present, it is a troublesome thing to measure the right angle of a large-size glass substrate. For the measurement of the perpendicular angle of flat objects, there are roughly two basic methods: optical methods and mechanical methods. [0003] 1. Optical method: Using the principle of light reflection, a laser emitting instrument fixed relative to the reference plane emits a straight line of light. The light is reflected by the emitting instrument, and the measuring instrument moves on the measured surface to measure the reading change of the reflected light on the scale instrument. This change value...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/26
Inventor 李赫然李学峰齐彦民
Owner TUNGHSU GRP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products