Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device for detecting medium refraction index change by utilizing spectrum intensity change

A technology of refractive index change and change detection, which is applied in the field of plasma optical sensing and biosensing, can solve problems such as complex equipment, achieve high sensitivity, flexible and controllable sensing range, and simple sensing optical path

Inactive Publication Date: 2010-09-08
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
View PDF7 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Surface plasmon wavelength modulation sensing usually uses a wide-spectrum light source. After total reflection by a prism, a spectrometer is used to analyze the intensity change of the reflected spectrum to obtain the corresponding incident light wave's resonance response to the metal surface plasmon wave. The equipment is complicated.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device for detecting medium refraction index change by utilizing spectrum intensity change
  • Device for detecting medium refraction index change by utilizing spectrum intensity change

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0038] Such as figure 1 as shown, figure 1 A schematic diagram of a device for detecting changes in the refractive index of a medium using changes in spectral intensity provided by the present invention, the device includes:

[0039] coupling prism 1;

[0040] A metal layer 2 evaporated on the surface of the coupling prism 1;

[0041] A sensing medium layer 3 coated on the surface of the metal layer 2;

[0042] Deformable Bragg reflector 4;

[0043] CCD sensor 5; and

[0044] A phosphor layer 6 coated on the surface of the CCD sensor 5;

[0045] Wherein, the parallel incident light wave a enters the metal layer 2 through the coupling prism 1 to undergo surface plasmon resonance coupling, and becomes a surface plasmo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
wavelengthaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a device for detecting medium refraction index change by utilizing spectrum intensity change, which comprises a coupling prism, a metal layer, a sensing medium layer, a deformation Bragg reflector, a CCD sensor and a fluorescent substance layer, wherein the metal layer is evaporated on the surface of the coupling prism; the sensing medium layer is coated on the surface of the metal layer; and the fluorescent substance layer is coated on the surface of the CCD sensor. After a broad-spectrum sensing beam passes through the coupling prism, surface plasma mode resonance of specific wavelength and the metal layer on the surface of the prism occurs, the surface plasma resonance wavelength can be modulated through the surface medium refraction index of the metal layer, different medium refraction indexes correspond to the surface plasmas coupling in different wavelength, a sensing beam reflection spectrum passing through the prism is reflected onto the CCD sensor through the light splitting of the deformation Bragg reflector, and the absorption of surface plasma resonance light in specific wavelength is detected by utilizing the spectrum intensity change of the corresponding wavelength at different positions of the CCD sensor to achieve the purpose of detecting the surface medium refraction index change of the metal on the prism.

Description

technical field [0001] The invention relates to the technical field of surface plasmon optical sensing and biological sensing, in particular to a device for detecting the change of medium refractive index by using the change of spectral intensity. Background technique [0002] Surface plasmon waves are electron density waves that propagate along the metal surface generated by the interaction between freely vibrating electrons and photons existing on the metal surface. When the surface plasmon wave propagates on the metal-medium surface, its evanescent wave field has a certain penetration depth in the medium. When the refractive index of the medium is disturbed, the propagation constant of the surface plasmon will change. The surface plasmon resonance sensor detects the change of the refractive index by measuring the change of the propagation constant. The variation of the propagation constant of the surface plasmon wave can be manifested by detecting the characteristic vari...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/41G01N21/55G01N21/64G01N21/552
Inventor 刘宏伟阚强王春霞陈弘达
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com