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Thickness detection method and device for transparent material

A transparent material, thickness detection technology, applied in the field of measurement, can solve the problem of inaccurate online measurement of wall thickness, and achieve the effect of fast online measurement

Inactive Publication Date: 2010-06-30
CHANGCHUN UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In the process of realizing the present invention, the inventor found that there are at least the following problems in the prior art: in the prior art, fast and accurate online measurement of the wall thickness of transparent materials such as glass containers in the production process cannot be realized

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  • Thickness detection method and device for transparent material
  • Thickness detection method and device for transparent material
  • Thickness detection method and device for transparent material

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Embodiment Construction

[0022] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0023] In view of the shortcomings in the prior art that rapid and accurate online measurement of the thickness of transparent materials cannot be realized, an embodiment of the present invention provides a thickness detection device for transparent materials, figure 1 It is a structural schematic diagram of an embodiment of a thickness detection ...

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Abstract

The embodiment of the invention provides a thickness detection method and device for a transparent material, wherein the device includes an optical measuring system, an optical analyzing system and a data processing system; the optical measuring system is used for outputting broadband light, receiving the reflective light of a detected transparent material and outputting the reflective light to the optical analyzing system; the optical analyzing system is used for analyzing the received reflective light of the detected transparent material so as to obtain a wavelength value corresponding to a reflection peak; the data processing system is used for obtaining the thickness of the detected transparent material according to the wavelength value corresponding to the reflection peak obtained by the optical analyzing system. The embodiment of the invention also provides a thickness detection method for the transparent material based on the device. The thickness detection method and device for the transparent material provided by the invention can realize to implement online detection on the thickness of the transparent material quickly and accurately.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of measurement, and in particular to a method and device for detecting the thickness of a transparent material. Background technique [0002] The wall thickness of glass containers is an important characteristic parameter that directly affects the quality of containers. During the production process of glass containers, accurate and rapid measurement of the wall thickness of glass containers is a prerequisite for improving the quality of glass containers. [0003] In the prior art, contact measurement technology can be used to measure the wall thickness of glass containers, and in the measurement method of quartz tube wall thickness, a wall thickness measurement system with a small measurement range has been developed by using laser scanning technology, and the above-mentioned glass container Most of the wall thickness measuring equipment can only measure the wall thickness of the q...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06
Inventor 徐熙平张宁乔杨
Owner CHANGCHUN UNIV OF SCI & TECH
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