Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Cluster-based fault critical clearing time parallel computing method

A critical removal time, parallel computing technology, applied in computing, special data processing applications, instruments, etc., can solve the problem that the computing time is difficult to meet the rapid changes of the working conditions, and achieve the effect of fast CCT and fast calculation

Inactive Publication Date: 2010-06-23
STATE GRID JIANGXI ELECTRIC POWER CO +1
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Parallel by fault requires repeated iterations to meet the requirements of calculation accuracy, and the calculation time may be difficult to meet the rapid changes in working conditions

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Cluster-based fault critical clearing time parallel computing method
  • Cluster-based fault critical clearing time parallel computing method
  • Cluster-based fault critical clearing time parallel computing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] Attached below figure 1 , the method of the present invention is described in detail.

[0021] figure 1 Step 1 describes the calculation method of determining the transient safety CCT and the dynamic safety CCT.

[0022] figure 1 In step 2, the description is to obtain the length L of the CCT search interval according to the upper and lower limits of the fault removal time variation of the fault. i .

[0023] figure 1 In step 3, it is described that the calculation accuracy ξ is determined according to the calculation parameters and the search interval i , if the calculation accuracy takes a relative value, the approximate CCT is calculated first, and then the calculation accuracy is estimated according to the relative value of the convergence accuracy. Filter out the faults whose 1 / 2 length of the search interval is greater than the calculation precision. The number of schemes of each failure has been determined and the flag is set to 0 (the failure of the flag ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A cluster-based fault critical clearing time parallel computing method distributes computing cores according to search interval lengths of faults and ensures the faults with great search intervals to receive more cores. If the tap position split step size of the fault is less than the computing accuracy, the number of cores required by the fault is determined according to the computing accuracy demand. When the absolute accuracy is adopted, if the tap position split step size meets the convergence accuracy, longer observation time is adopted to directly obtain the transient state security CCT and dynamic security CCT through once iteration; else, shorter observation time is adopted to obtain transient security CCT and set the transient security CCT as the upper limit, and then the longer observation time is utilized to obtain the dynamic security CCT. When the relative accuracy is adopted, the transient security CCT is firstly obtained and the dynamic security CCT is subsequently obtained. When the security stability indexes of various power systems are taken into consideration, the minimum one of the angle stability CCT, the voltage security CCT, frequency security CCT and dynamic security CCT is obtained.

Description

technical field [0001] The invention belongs to the technical field of electric power systems and automation thereof. More precisely, the invention relates to a method for calculating critical fault removal time based on clusters. Background technique [0002] The fault critical removal time (CCT) corresponds to the maximum fault removal time for the power system to maintain safety and stability, and it can measure the safety and stability level of the system to a certain extent. Generally speaking, corresponding to the transient and dynamic safety and stability problems of power systems, CCT includes transient safety CCT (power angle stability CCT, transient voltage safety CCT, transient frequency safety CCT) and dynamic safety CCT. [0003] With the development of cluster technology, using high-performance computing technology to solve the calculation problems of large-scale power systems is considered to be an effective method to realize online analysis and calculation of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 金学成鲍颜红谭永香徐伟应忠德王胜明万源崔晓丹刘有飞邵伟
Owner STATE GRID JIANGXI ELECTRIC POWER CO
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com