System and method for analyzing technical hotspots and blank spots in patent analysis

A technology of technical hotspots and patent analysis, which is applied in the field of analysis system to achieve the effect of improving analysis efficiency and facilitating analysis

Inactive Publication Date: 2010-05-26
J Z M C INTPROP DATA SCI & TECH
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  • Abstract
  • Description
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Problems solved by technology

However, with the continuous development of science and technology, the amount of patent information is very large. There may be tens of thousands of patent documents in a specific technical field, as many as hundreds of thousands or millions. Unable to meet the needs of enterpri...

Method used

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  • System and method for analyzing technical hotspots and blank spots in patent analysis
  • System and method for analyzing technical hotspots and blank spots in patent analysis
  • System and method for analyzing technical hotspots and blank spots in patent analysis

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Embodiment Construction

[0020] see figure 1 Block diagram of the analysis system of the present invention. As shown in the figure, the system modules include a patent database 100 , a patent technology analysis module 200 , and an image output module 300 of technical hot spots and blank spots.

[0021] The patent database 100 is a database that uses mature commercial databases as the background to store and manage relevant patent information. Patent-related information includes patent bibliographic items, patent abstracts, and patent claims. The patent information in the patent database is imported into the database after pre-searching and processing. The patent database is installed on the network server, and technicians as clients can log in to the patent database 100 with IP address 1, IP address 2, IP address 3, etc. to perform patent retrieval and query.

[0022] The patent technology analysis module 200 in the analysis system of the present invention is presented to the user through a visual...

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Abstract

The invention provides a system and a method for analyzing technical hotspots and blank spots in patent analysis, which can display the technical hotspots and blank spots of patent technologies in a certain technical field by a matrix intuitively. The horizontal axis of the matrix chart represents the patent functional effects to be achieved, the vertical axis represents the technical means adopted by the patent, and the intersections represents the number of the patents of the corresponding technical mean which can realize the functional effect. By the analysis system, enterprises can discover the hotspots and the blank spots of the patent technology from a great number of patent information as plain as daylight and rapidly grips the focused patent technical information, thus improving analysis efficiency.

Description

technical field [0001] The present invention relates to an analysis system and method, in particular to an analysis system and method for technical hot spots and blank spots in patent analysis. Background technique [0002] Patent information is an important strategic intelligence resource. According to statistics from the World Intellectual Property Organization: 95% of the world's technologies are disclosed through patent information. Patent information can help us fully understand the competitive environment, learn from existing technologies, bypass patent barriers and patent traps, avoid patent disputes, and objectively formulate Competitive Strategy. In view of the importance of patent information, how to make full use of patent information to provide a basis for enterprise technology research and development innovation has become the focus of attention of enterprises. [0003] At present, patent analysis has become an important means for enterprises to use patent inf...

Claims

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Application Information

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IPC IPC(8): G06F17/30
Inventor 郭玲魏国柱唐向东
Owner J Z M C INTPROP DATA SCI & TECH
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