Open circuit detection system and its method

Abstract

The invention discloses a detecting system and a method used for judging whether a pin of an electronic component is properly coupled to a circuit device, the detecting system comprises a measured signal source, a signal induction unit, a signal processor and an analyzing unit, wherein, the signal processor is provided with induction signals which are filtered and sensed by sampling and the induction signals are corresponding to the measured signals which are input by the electronic component. Besides, the analyzing unit controls the change of frequency and amplitude of the measured signals according to the fact that whether the induction signals are wrong signals.

Description

field of invention [0001] The invention relates to a detection system and a method thereof, and in particular to a detection system and a method thereof for detecting whether there is empty welding between pins of an electronic component and a circuit assembly. technical background [0002] In the test of the assembled circuit board (Print Circuit Board Assembly, PCBA), when testing at the front end of the production line, a very important step is to check each integrated circuit (Integrated Circuits, ICs) on the printed circuit board (Print Circuit Boards) Whether electronic components such as connectors or connectors are firmly and correctly connected to the printed circuit board, such a test can reduce defects that occur during the back-end functional test (Functional Test), and effectively detect front-end process defects ( Manufacture Defects). Generally, In-Circuit Tester (ICT) uses the so-called Manufacture Defect Analyzer (MDA) to automatically and quickly find out ...

AI Technical Summary

Problems solved by technology

[0005] Another example is the simultaneous and multi-channel detection method proposed by US Patent Nos. US5486753 and US539199, which also uses capacitive coupling, but the structure is complex and difficult to implement in an online tester with low-cost requirements.

In addition, in the electric field detection device proposed in Taiwan Patent No. TW540709, its structure is complex, and the probes and fixtures used for detection are not in line with the mainstream market, and the cost is relatively high.

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