Flexible substrate, method of fabricating the same, and thin film transistor using the same
lexible substrate technology, applied in the field of flexible substrate, a method of fabricating the same, and a thin film transistor using the same, can solve the problems of flexible substrate, residual stress may be generated in the buffer layer, and the flexible substrate cannot be used in the process of forming a tft of polysilicon or in a high-temperature deposition process, so as to prevent or substantially minimize the deformation of the substrate and prevent or substantially minimize the delamination of the buffer layer
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[0062]A silicon oxide layer was formed on four different metal substrates. In particular, a silicon oxide layer was formed on a stainless steel 304 (SUS 304) substrate, on a stainless steel 430 (SUS 430) substrate, on a Fe-42Ni substrate, and on an Invar substrate. It is noted that a coefficient of thermal expansion as of stainless steel 304 (SUS 304) is 17.3 ppm / ° C., a coefficient of thermal expansion as of stainless steel 430 (SUS 430) is 10.5 ppm / ° C., a coefficient of thermal expansion as of Fe-42Ni is 3.238 ppm / ° C., and a coefficient of thermal expansion αs of Invar is 1.2 ppm / ° C. The silicon oxide layer was formed on each of the metal substrates at 330° C. A residual stress σr of each of the silicon oxide layers and a curvature of each of the metal substrates was measured. Results are reported in FIGS. 1-2.
[0063]As illustrated in FIGS. 1-2, as a coefficient of thermal expansion of a metal substrate increased, the residual stress of a corresponding buffer layer thereon, i.e....
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