Multi-port memory device with serial input/output interface

Abstract

A multi-port memory device including: a plurality of serial input / output (I / O) data pads; a plurality of parallel I / O data pads; and a plurality of first ports for via the serial I / O a data pad for performing serial I / O data communications with an external device; a plurality of memory banks for performing parallel I / O data communications with the first ports via a plurality of first data buses; and a second port for performing parallel I / O data communications with the external devices via the parallel I / O data pads and performing serial I / O with the first ports via a plurality of second data buses during test mode data communication.

Description

technical field [0001] The present invention relates to a multi-port memory device, and more particularly, to a test interface for a multi-port memory device with a serial input / output (I / O) interface for handling multiple simultaneous operations with an external device . Background technique [0002] In general, most memory devices, including random access memory (RAM), have a single port with multiple sets of input / output pins. That is, a single port is provided for data exchange between the memory device and an external chipset. Such memory devices with a single port use a parallel input / output (I / O) interface to simultaneously transfer multi-bit data via signal lines connected to multiple I / O pins. The memory device exchanges data with external devices via a plurality of I / O pins in parallel. [0003] The I / O interface is an electrical and mechanical system (scheme) that connects unit devices with different functions through signal lines and accurately transmits trans...

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Problems solved by technology

[0029] In this situation, traditional test equipment used to test typical DRAM devices has limitations in transmitting and recognizing high-speed data signals

Therefore, it is difficult to verify the operation of multi-port memory devices, so that high-speed test equipment is required

However, since the introduction of high-speed test equipment requires a large investment, the unit manufacturing cost increases and the competitiveness of products decreases accordingly

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