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Image defect inspecting apparatus and image defect inspecting method

A defect inspection and image technology, which is applied in image communication, image enhancement, image analysis, etc., can solve the problems of loss of robustness of image matching device, inability to calculate normalized correlation value, etc.

Inactive Publication Date: 2004-03-17
FUJIFILM BUSINESS INNOVATION CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

That is to say, the advantages of defect inspection brought by the normalized correlation of the image matching device, that is, the shift change of the image gray level value and the change of the illumination light amount, lose the higher robustness of the image matching device
[0013] Also, in the technique disclosed in JP-A-Hei.7-121711, when there is no change in the gray level value in the template image of the reference image, the following basic problem cannot be solved, that is, the technique cannot calculate the normalized correlation value

Method used

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  • Image defect inspecting apparatus and image defect inspecting method
  • Image defect inspecting apparatus and image defect inspecting method
  • Image defect inspecting apparatus and image defect inspecting method

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Embodiment Construction

[0026] Embodiment modes of the present invention will now be described with reference to the drawings. In this description, the present invention is constructed as a part of a print processing system (image output device) of a laser printer.

[0027] figure 1 is a schematic block diagram for explaining a print processing system to which the image defect inspection apparatus of the present invention is applied. The image defect inspection device is installed in the figure 2 on a laser printer (hereinafter referred to as "printer") 201.

[0028] Such as figure 1 As shown, in the print processing system, a CPU 101, a RAM 102, a hard disk drive (HDD) 103, an external interface circuit (external interface) 104, an IOT controller 105 (IOT: Image Output Terminal), and a CCD for a CCD camera The camera interfaces 107 are connected to each other via a data bus 108 . An external interface 104 is employed in order to input print data from the outside. Print data is described in a ...

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Abstract

An image defect inspecting apparatus of the present invention includes a template image producing section for producing a template image from reference image data, a corresponding image extracting section for extracting a predetermined image located at a position corresponding to a template image from digital data of a scanned image for inspection, data embedding sections for embedding desired same pattern data into the template image and the image extracted by the corresponding image extracting section, a normalized correlation value calculation processing unit for acquiring a normalized correlation coefficient from the template image and the extracted image, into which the pattern data is embedded, and a defect judging section for judging as to whether a defect is present by comparing the normalized correlation coefficient acquired by the normalized correlation value calculation processing unit with a predetermined threshold value so as to acquire a large / small relationship thereof.

Description

technical field [0001] The present invention relates to an image inspection device and an image inspection method, and more particularly to an image inspection device and an image inspection method used in an image output device for outputting an image recording medium on which an image is recorded based on image data. Background technique [0002] Conventionally, as a method for inspecting defects contained in an output image, a defect inspection method based on a normalized correlation method has been proposed. An advantage of this defect inspection method is that defect inspection can be performed in a correct manner even when the contrast of the scanned image for inspection differs from that of a reference image due to changes in lighting conditions. [0003] The normalized correlation value C between the template image T(i,j) with N×M pixels generated from the reference image data and the image I(i,j) extracted from the scanned image for inspection is calculated accordi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G06F17/15G06F17/18G06T1/00G06T7/00H04N1/00
CPCH04N1/00031H04N1/00047H04N1/00079H04N1/0005H04N1/00015H04N1/00068H04N1/00002G06T2207/30144G06T7/001H04N1/00076
Inventor 安川薰足立康二山田纪一中川英悟上床弘毅里永哲一
Owner FUJIFILM BUSINESS INNOVATION CORP
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