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Improved calibration of vector network analyzer

A technology of vector network analysis and calibration data, applied in the field of improved calibration, can solve troublesome and time-consuming problems

Inactive Publication Date: 2003-09-17
TEKTRONIX INC
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Problems solved by technology

[0003] Here's the problem: While a VNA gives excellent results, the calibration is done for every exact frequency step used in the measurement
Many users do not require extremely accurate measurements and find it cumbersome and time-consuming to recalibrate their vector network analyzer every time the frequency variable changes, even by a small amount

Method used

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  • Improved calibration of vector network analyzer
  • Improved calibration of vector network analyzer
  • Improved calibration of vector network analyzer

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Embodiment Construction

[0010] now refer to figure 1 Illustrating the simplest form of vector network analyzer 10 , vector network analyzer 10 has internal signal source 12 , return loss bridge 14 , receiver 16 and control processor 18 . During calibration, a calibration impedance 20 is selectively applied to the test port 22 of the return loss bridge 14 . Calibration impedance 20 generally includes open circuit, short circuit and characteristic reference impedance. For each reference impedance, a set of calibration measurements is stored in response to the forward path signal from the internal signal source 12, whose reflections from the test ports are processed by the receiver 16 as return data to produce complex (I,Q) reflections Calibration measurement data in the form of coefficients. Then, the vector network analyzer 10 is connected to the device or system under test for measurement, so as to obtain the reflection coefficient of the device or system. The measured reflection coefficient is co...

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Abstract

Improved calibration method for vector network analyzers stores sparse calibration data, interpolates systematic error data using the sparse calibration data from each measurement made by the vector network analyzer, and from the systematic error data at each measurement frequency and the uncorrected Measurement Data Creates calibrated measurement data. Sparse calibration data may be generated by measuring every Nth frequency step over the calibration frequency range greater than the specified measurement frequency range, or by measuring every frequency step over the calibration frequency range and compressing the resulting measurement data. Interpolation can be achieved by using a curve fitting algorithm such as a parametric polynomial curve fitting algorithm.

Description

technical field [0001] This invention relates to vector network analyzers and, more particularly, to an improved calibration method for vector network analyzers. Background technique [0002] To obtain accurate results, users of vector network analyzers calibrate their instruments by measuring three known impedance standards, which for one-port measurements are typically shorts, opens, and the characteristic impedance (Z 0 )load. For two-port measurements, three additional measurements are made with no-connect and thru connections between ports. The results of these measurements are used to mathematically correct the systematic errors of the vector network analyzer, resulting in excellent measurement accuracy. The measurement consists of multiple stepped measurements on successive frequencies that the user appears to "sweep" while the device under test (DUT) is being measured. Each measurement point has "calibration" data taken during the calibration procedure, which are ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00G01R23/173G01R27/28G01R27/32
CPCG01R27/32G01R35/005
Inventor T·C·希尔X·陈S·J·马托斯L·J·维尔曼K·L·贝尔纳德L·F·古姆
Owner TEKTRONIX INC
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