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Dynamic memory function test method

A dynamic memory and functional testing technology, applied in the detection of faulty computer hardware, etc., can solve problems such as difficulty in debugging, high requirements for developers, and inconvenience in outputting debugging information.

Inactive Publication Date: 2005-03-23
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to improve the test speed and test code efficiency, the above test programs are generally written in assembly language, which has relatively high requirements for developers.
[0007] In addition, the serial port or network port of the board is generally initialized after the program is saved in SDRAM. When using the current method to debug the SDRAM test program, the serial port or network port has not been initialized, so it is inconvenient to output detailed information. The debugging information can only be output through other simple ways, so debugging is relatively difficult

Method used

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Embodiment Construction

[0014] The present invention will be described in further detail below through specific embodiments and in conjunction with the accompanying drawings.

[0015] figure 1 The circuit shown is commonly found in various single boards of various products, and it is a part of the smallest system of the CPU, which is a very general design method. For different boards, CPU types, SDRAM models and capacities may be different. The importance of this part of the circuit on the board is obvious, so a comprehensive test must be carried out on this part of the circuit before the board leaves the factory.

[0016] Generally speaking, the single-board software is stored in FLASH (or other ROM). If you do not move the program to SDRAM, but directly run the test program in FLASH (or other ROM) to conduct a comprehensive test on SDRAM, test The time may be longer. For example, during the experiment, we found that it takes more than one minute to run the program directly from FLASH to test 32M...

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Abstract

The dynamic memory function test method features the sectional test .The program in the EEROM is transferred to the dynamic memory, and the dynamic memory is then tested through test-removal-test-recovery-removal-test-recovery process until completing the test of all sections. During the test, if some error is found, the test will be paused while the error information is reported. Owing to the save and restore of the content in each section, the program may run normally. The present invention has high test speed, and this makes it possible to use only higher order language rather than assembly language and facilitates the program debugging.

Description

Technical field: [0001] The invention relates to a dynamic memory function testing method. Background technique: [0002] At present, the minimum CPU system on a single board generally includes devices such as a central processing unit CPU, an electrically erasable memory FLASH (BOOTROM) and a dynamic memory SDRAM, such as figure 1 As shown in , the CPU is the core of the board and is used to perform various operations specified by the board software. FLASH is an electrically erasable memory, even if the board is powered off, the program or data stored in it will not be lost. The CPU can easily read out the content in the FLASH, but only in certain circumstances can it be erased and written. SDRAM is a dynamic memory. After the board is powered off, the programs or data stored in it will be lost, and the CPU can easily read and write SDRAM. The characteristics of these two memories determine that the CPU reads and writes data in FLASH slowly, but reads and writes data in ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 胡勇朱星海
Owner HUAWEI TECH CO LTD
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