Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Temperature drift attenuation method for digital oscilloscope and digital oscilloscope

A technology of digital oscilloscope and attenuation network, which is applied in the direction of digital variable display, digital variable/waveform display, instruments, etc., to improve user experience and enhance the effect of waveform display

Active Publication Date: 2022-06-03
SHENZHEN CITY SIGLENT TECH
View PDF14 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem mainly solved by the present invention is: how to attenuate the technical problem that the display waveform of the oscilloscope will produce temperature drift due to temperature changes

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Temperature drift attenuation method for digital oscilloscope and digital oscilloscope
  • Temperature drift attenuation method for digital oscilloscope and digital oscilloscope
  • Temperature drift attenuation method for digital oscilloscope and digital oscilloscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

Please refer to Figure 5 , is a schematic structural diagram of a digital oscilloscope in another embodiment. The digital oscilloscope 1 includes a controller 14 , an attenuation network 11 , an impedance transformation network 18 , a first adjustable gain amplifier 12 , an analog-to-digital converter 13 , and an offset adjustment circuit 17 . , bias gain circuit 19 , digital to analog converter 16 and display 15 . The attenuation network 11 is connected to the impedance transformation network 18 . The attenuation network 11 is used to attenuate the input signal VIN input to the digital oscilloscope 1 to obtain the first adjustment signal VIN1 and output the first adjustment signal VIN1 to the impedance transformation network 18 . The digital-to-analog converter 16 is respectively connected with the controller 14 and the offset adjustment circuit 17, and the digital-to-analog converter 16 is used for converting the offset code of a digital signal output by the controller 14 in...

Embodiment 2

Please refer to Image 6 , is a schematic flowchart of a method for attenuating temperature drift for a digital oscilloscope in another embodiment. The digital oscilloscope includes an impedance transformation network, a bias adjustment circuit and an attenuation network, and the method for attenuating temperature drift includes:

Step 100, obtaining the vertical scale setting value of the digital oscilloscope;

Step 200, adjusting the bias voltage signal;

Attenuate or amplify the offset voltage signal output by the offset adjustment circuit of the digital oscilloscope according to the vertical scale setting value, and output the attenuated or amplified offset voltage signal to the impedance transformation network, so that the impedance transformation network will attenuate or amplify the offset voltage signal. The amplified bias voltage signal is superimposed with the output signal of the attenuation network of the digital oscilloscope, so that the temperature drift phenomen...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a temperature drift attenuation method for a digital oscilloscope and the digital oscilloscope. The digital oscilloscope comprises an impedance conversion network, an attenuation network and a bias adjustment circuit. Firstly, a vertical gear setting value of the digital oscilloscope is obtained; then, a bias voltage signal output by the bias adjusting circuit is attenuated or amplified according to the vertical gear set value, and the attenuated or amplified bias voltage signal is output to the impedance conversion network, so that the impedance conversion network superposes the attenuated or amplified bias voltage signal and an output signal of the attenuation network; and the temperature drift phenomenon is attenuated when the digital oscilloscope displays the waveform. The bias voltage signal is adjusted according to the vertical gear setting value, so that the temperature drift phenomenon is attenuated, the waveform display effect of the digital oscilloscope is enhanced, and the user experience is improved.

Description

technical field [0001] The invention relates to the technical field of oscilloscopes, in particular to an attenuation temperature drift method for a digital oscilloscope and a digital oscilloscope. Background technique [0002] Digital oscilloscopes are an indispensable tool for designing, manufacturing and maintaining electronic equipment. Today's oscilloscopes are mostly digital oscilloscopes, which are increasingly popular due to their functions such as waveform triggering, storage, display, measurement, and analysis. With the rapid development of digital oscilloscopes, digital oscilloscopes are considered to be the eyes of engineers, which will be used as a necessary tool to meet the measurement challenges of engineers. Especially in the development process of electronic circuits, oscilloscopes are often used for debugging and measurement, and the measurement accuracy is getting higher and higher, and the performance requirements of oscilloscopes are getting higher and h...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R13/02
CPCG01R13/02G01R13/0218
Inventor 曾显华陈滨慰谢炳涛
Owner SHENZHEN CITY SIGLENT TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products