Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Electrostatic forming film reflector antenna integral finite element modeling method and system

An electrostatic forming, antenna integral technology, applied in geometric CAD, design optimization/simulation, special data processing applications, etc., can solve the problems of complex modeling and difficult structure optimization of electrostatic forming thin-film reflector antennas

Pending Publication Date: 2022-03-01
QINGDAO UNIV OF SCI & TECH
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] Aiming at the problems existing in the prior art, the present invention provides an overall finite element modeling method and system for an electrostatically formed thin film reflector antenna, and particularly relates to a parameterization-based overall finite element modeling method for an electrostatically formed thin film reflector antenna and its The system aims to solve the problem that the overall modeling of the electrostatically formed film reflector antenna is complex and difficult to optimize the structure

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electrostatic forming film reflector antenna integral finite element modeling method and system
  • Electrostatic forming film reflector antenna integral finite element modeling method and system
  • Electrostatic forming film reflector antenna integral finite element modeling method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0067] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0068] Aiming at the problems existing in the prior art, the present invention provides an integral finite element modeling method and system for an electrostatically formed film reflector antenna. The present invention will be described in detail below in conjunction with the accompanying drawings.

[0069] Such as figure 1 As shown, the overall finite element modeling method of the electrostatically formed film reflector antenna provided by the embodiment of the present invention includes the following steps:

[0070] S101, given the geometric modeling parameters of the electrostatically formed film reflector antenna;

...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of spaceborne antenna simulation, and discloses an overall finite element modeling method and system for an electrostatic forming film reflector antenna, and the method comprises the steps: giving geometric modeling parameters of the electrostatic forming film reflector antenna; establishing a cable membrane electrode surface structure comprising a cable net support and a membrane electrode surface; establishing a thin film reflecting surface structure comprising a boundary inhaul cable; establishing an expandable support truss structure; and integral finite element modeling of the electrostatic forming thin film reflector antenna is completed. According to the method, parametric modeling is carried out on the deployable supporting truss, the cable membrane electrode surface and the thin film reflecting surface of the electrostatic forming thin film reflecting surface antenna, so that high-precision finite element modeling analysis and structure optimization of the electrostatic forming thin film reflecting surface antenna can be carried out; the static forming film reflector antenna integral model with different size parameters can be conveniently established, and a basis is provided for high-precision analysis and structure optimization of the static forming film reflector antenna.

Description

technical field [0001] The invention belongs to the technical field of space-borne antenna simulation, and in particular relates to an integral finite element modeling method and system for an electrostatically formed thin-film reflector antenna. Background technique [0002] At present, the electrostatically formed film reflector antenna is generally composed of an expandable support truss, a cable-membrane electrode surface, and a film reflector. A reasonable establishment of the overall model of the electrostatically formed film reflector antenna is the key to accurately analyzing the structural performance of the electrostatically formed film reflector antenna. . [0003] However, most of the industry has not established an overall model for the modeling and analysis of electrostatically formed film reflector antennas, and there is no parametric modeling method for antenna structure optimization. Surya P.Chodimella, James D.Moore et al. only established the models of th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/23G06F30/18
CPCG06F30/23G06F30/18
Inventor 谷永振张庆港赵海霞史伟杰张永涛武路鹏李向荣李军英
Owner QINGDAO UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products