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IGBT double-pulse test method and system, IGBT control method and inverter controller

A test method, double-pulse technology, applied in bipolar transistor test, irreversible DC power input conversion to AC power output, single semiconductor device test, etc., can solve the problem of simple logic, lack of effective test method and test data support, It is impossible to better evaluate the IGBT output capability and other issues, so as to achieve the effect of guaranteeing objectivity

Active Publication Date: 2022-01-21
GAC AION NEW ENERGY AUTOMOBILE CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The embodiment of the present invention provides an IGBT double-pulse test method and system to solve the problem that the current safe working area of ​​the IGBT lacks effective test methods and test data support, and cannot be better The problem of evaluating the output capability of the IGBT
[0005] The embodiment of the present invention provides an IGBT control method and an inverter controller to solve the problem that the current IGBT control logic is simple and the safe working area of ​​the IGBT cannot be fully utilized

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  • IGBT double-pulse test method and system, IGBT control method and inverter controller
  • IGBT double-pulse test method and system, IGBT control method and inverter controller
  • IGBT double-pulse test method and system, IGBT control method and inverter controller

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Embodiment Construction

[0050] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0051] The IGBT double-pulse test method provided by the embodiment of the present invention, the IGBT double-pulse test method is applied in the IGBT double-pulse test system, the IGBT double-pulse test system includes a test controller, an oscilloscope and a pulse driver connected to the test controller, an oscilloscope and The pulse drivers are all connected to the IGBT to be tested, and the test controller includes a memory, a processor, and a compu...

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Abstract

The invention discloses an IGBT (Insulated Gate Bipolar Translator) double-pulse test method and system, an IGBT control method and an inverter controller. The IGBT double-pulse test method comprises the following steps: acquiring to-be-verified data from an original SOA curve, wherein the to-be-verified data comprises a to-be-tested current and an original threshold voltage corresponding to the to-be-tested current; based on the to-be-tested current and the original threshold voltage, performing a double-pulse test on the to-be-tested IGBT, and obtaining a test safety voltage corresponding to the to-be-tested current; and constructing a verification SOA curve corresponding to the to-be-tested IGBT based on the to-be-tested current and the test safety voltage. According to the method, it can be guaranteed that construction of the verification SOA curve has enough test data support, objectivity is achieved, the output capacity of the IGBT can be well evaluated based on the verification SOA curve, and the IGBT is controlled to work safely.

Description

technical field [0001] The invention relates to the field of IGBT application technology, in particular to an IGBT double-pulse test method and system, an IGBT control method and an inverter controller. Background technique [0002] In the application environment of electric vehicle inverters, due to the existence of stray inductance in the circuit where the IGBT is located, when the IGBT is turned off, a peak voltage will be generated at both ends of the IGBT. When the peak voltage is greater than the withstand voltage of the IGBT, the IGBT will be damaged. . In order to avoid the above situation, hardware and software can be used for protection. In the hardware protection mode, the voltage clamping technology is mainly used to reduce the turn-off peak voltage; in the software protection mode, the output current is mainly reduced. off peak voltage. [0003] In the existing software protection methods, there are mainly the following two control strategies: the first one is...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26H02M7/48
CPCG01R31/2608H02M7/48G01R31/26
Inventor 林川川李启国蔡仕基周梅
Owner GAC AION NEW ENERGY AUTOMOBILE CO LTD
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