IGBT double-pulse test method and system, IGBT control method and inverter controller
A test method, double-pulse technology, applied in bipolar transistor test, irreversible DC power input conversion to AC power output, single semiconductor device test, etc., can solve the problem of simple logic, lack of effective test method and test data support, It is impossible to better evaluate the IGBT output capability and other issues, so as to achieve the effect of guaranteeing objectivity
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[0050] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0051] The IGBT double-pulse test method provided by the embodiment of the present invention, the IGBT double-pulse test method is applied in the IGBT double-pulse test system, the IGBT double-pulse test system includes a test controller, an oscilloscope and a pulse driver connected to the test controller, an oscilloscope and The pulse drivers are all connected to the IGBT to be tested, and the test controller includes a memory, a processor, and a compu...
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