Thyristor Multi-stress Accelerated Aging Test Device and Application Method for High-voltage Converter Valve

Abstract

The invention relates to a multi-stress accelerated aging test device for a thyristor used in a high-voltage converter valve and a method for using it, which includes: a test box, a square structure composed of double-layer metal plates, and an interlayer between the double-layer metal plates; a vibration generating device, It is installed at the bottom of the test chamber to generate mechanical stress; the thyristor clamping device to be tested is installed on the top of the vibration generating device to clamp the thyristor to be tested and dissipate heat; the thermal stress generating device is installed outside the test chamber , which is connected with the clamping device of the thyristor to be tested, is used to generate thermal stress; the salt spray generator is installed on one side of the outer wall of the test chamber, and is used to input the generated wet stress into the test chamber; the radiation generating device is arranged in the test chamber One side of the outer wall is used to input the generated magnetic radiation stress into the test chamber; the central control system is connected to each generating device to receive detection information and send control signals to each generating device according to the test requirements.

Description

technical field [0001] The invention relates to the technical field of thyristors, in particular to a thyristor multi-stress accelerated aging test device for a high-voltage converter valve and a use method thereof. Background technique [0002] High-voltage and high-power thyristors are key components of converter valves in EHV or UHV DC transmission projects. The health of thyristors directly affects the safety and reliability of DC transmission projects. During the working process of thyristors, under the joint action of high voltage, high current, temperature, humidity, mechanical vibration, and radiation, etc., aging of thyristors is inevitable, and its performance parameters also change with aging. A comprehensive grasp of the law of thyristor aging and its parameter degradation is of great significance for evaluating the state of thyristors, formulating scientific maintenance plans, and predicting the remaining life of thyristors. [0003] Thyristors are long-life de...

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problem of single stress applied in the above-mentioned thyristor aging test, the object of the present invention is to provide a thyristor multi-stress accelerated aging test device for high-voltage converter valves and a method of use, which can simultaneously apply thermal stress, humidity stress, mechanical stress, radiation stress, etc. Multiple stresses such as stress can greatly improve the accuracy of the thyristor accelerated aging test, so that the accelerated aging test of the thyristor can better approach the aging law under normal working conditions

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