Method and device for testing application program

A technology of application programs and testing methods, applied in the computer field, can solve problems such as not being able to support multiple versions of testing at the same time, complex testing systems, and high testing costs, so as to improve testing flexibility, streamline testing processes, and reduce testing costs. cost effect

Pending Publication Date: 2021-06-22
BEIJING WODONG TIANJUN INFORMATION TECH CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. Multiple cluster environments need to be deployed, which cannot well support multiple versions to be tested at the same time, and the test cost is high;
[0005] 2. For testing based on version functional features, the test system is too complex and needs to be hard-coded to support multiple version branches for testing. The splitting logic of the test is coupled in the business, which has low flexibility and needs to be moved after the test is completed. In addition to the corresponding test code and shunt code

Method used

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  • Method and device for testing application program
  • Method and device for testing application program
  • Method and device for testing application program

Examples

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Embodiment Construction

[0035] The exemplary embodiments of the present invention will be described below, including various details of the embodiments of the present invention to help understand, and they should be considered as exemplary. Accordingly, it will be appreciated by those skilled in the art that various changes and modifications described herein are made without departing from the scope and spirit of the invention. Similarly, a description of the well-known functions and structures is omitted in order to clear and concise, the following description is omitted.

[0036] figure 1 It is a schematic diagram of the main flow of the test method of the application according to the first embodiment of the present invention; figure 1 As shown, the test method of the application provided by the embodiment of the present invention mainly includes:

[0037] Step S101, the version number of the application to be tested to be tested according to the test plan and test function.

[0038] According to an e...

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PUM

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Abstract

The invention discloses a method and a device for testing an application program, and relates to the technical field of computers. A specific embodiment of the method comprises the steps of formulating a version number of a to-be-tested version of an application program according to a test plan and a test function; testing clusters are deployed according to the types of the testing functions, and the testing clusters comprise a formal cluster and a gray scale cluster; and determining a target user corresponding to each version number through the shunting configuration, so that the target user accesses a corresponding test cluster according to the version number indicated by the shunting configuration to test a corresponding function. According to the embodiment, the test process is simplified, the test flexibility is improved, and the test cost is reduced.

Description

Technical field [0001] The present invention relates to the field of computer technology, and more particularly to a test method and apparatus for an application. Background technique [0002] The application version of the application can help the research team find problems through quick trials and correct issues in time before large-scale push users, greatly reduce a lot of risks. Making version tests not only meet some of the desires of people first experience, but also developing R & D teams that are not easy to discover, but also collect real user experiences, which are very helpful for optimizing new system content. [0003] In implementing the invention, the inventors have found that there is at least the following problems in the prior art: [0004] 1. Need to deploy multiple cluster environments, you can't support multiple versions of multiple versions simultaneously, and the test cost is high; [0005] 2. For testing based on version feature, the test system is too com...

Claims

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Application Information

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IPC IPC(8): G06F11/36G06F8/71
CPCG06F11/3664G06F11/3688G06F8/71
Inventor 马刚高毅
Owner BEIJING WODONG TIANJUN INFORMATION TECH CO LTD
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