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Ground test multi-dimensional optimization method for on-orbit fault prediction of spacecraft

A technology of ground testing and optimization methods, applied in special data processing applications, geometric CAD, etc.

Active Publication Date: 2021-01-22
BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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Problems solved by technology

The existing ground test optimization method for spacecraft on-orbit failure prediction needs to be improved

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  • Ground test multi-dimensional optimization method for on-orbit fault prediction of spacecraft
  • Ground test multi-dimensional optimization method for on-orbit fault prediction of spacecraft
  • Ground test multi-dimensional optimization method for on-orbit fault prediction of spacecraft

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Embodiment Construction

[0046] In order to enable those skilled in the art to better understand the technical solution of the application, the application will be described in detail below in conjunction with the accompanying drawings. The description in this part is only exemplary and explanatory, and should not have any limiting effect on the protection scope of the application. .

[0047] This embodiment provides a ground test multi-dimensional optimization method for spacecraft on-orbit failure prediction, the method flow chart is as follows figure 1 As shown, the method includes the following steps:

[0048] S1. Determine the characteristic parameters of the stand-alone to the platform; the characteristic parameters include all on-orbit faults of the stand-alone and the correlation vector R of the ground test t t ;

[0049] The correlation vector R of all on-orbit faults and ground test t of the single machine t Obtained from the research on the mechanism of on-orbit faults and the analysis o...

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Abstract

The invention provides a ground test multi-dimensional optimization method for on-orbit fault prediction of a spacecraft. The method comprises the steps of determining characteristic parameters of a single machine to a platform; wherein characteristic parameters comprise relevancy vectors of all on-orbit faults and ground tests of the single machine; judging whether the relevancy between the single-machine on-orbit fault and the ground test is 0 or not; judging whether the number of ground faults exposed by the single machine in the ground test is 0 or not; establishing a result of whether theground test is tailored or not; giving corresponding optimization suggestions according to test item correlation, test condition correlation, test technology correlation and fault identification method correlation values of an on-orbit fault of the single machine and a ground test, and establishing and updating an optimization suggestion matrix of the single machine for the ground test. Characteristic parameters of a spacecraft stand-alone product to a platform are established, and a ground test project, test conditions, a test technology and a fault identification method multi-dimensional optimization method in a test for spacecraft on-orbit fault prediction are formed.

Description

technical field [0001] The present application relates to the technical field of spacecraft ground tests, in particular to a multi-dimensional optimization method for ground tests oriented to spacecraft on-orbit failure prediction. Background technique [0002] The spacecraft ground test is an important part of spacecraft hardware quality assurance. The spacecraft ground test has a great impact on the development progress and reliability of the spacecraft, and it takes a lot of money and time. The test cost of one model can account for the entire development. 20%-40% of the fee. Therefore, it is of great significance to improve the test adequacy of the spacecraft through test optimization, so that the defects of the spacecraft can be exposed to the maximum on the ground, and at the same time reduce the cost and time during the ground test. [0003] Generally speaking, a large number of different types of test items such as thermal, mechanical and space environments, as well...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/15
CPCG06F30/15
Inventor 纪欣言向树红王晶苏新明毕研强杜春林李西园
Owner BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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