Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Unitary linear point-by-point analysis method, system and device for standardized residual error test method

A technology for standardizing residuals and analysis methods, which is applied in the field of chemical analysis and can solve problems such as troublesomeness, difficulty in drawing conductometric titration, and inability to automatically determine the titration end point.

Active Publication Date: 2021-01-22
XINJIANG ACADEMY OF AGRI & RECLAMATION SCI
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, conductometric titration is often used as a graphic method to determine the titration end point. This is a manual operation, which is cumbersome and cannot automatically determine the titration end point.
Although in recent years, computers have been used to solve the problem of difficult conductivity titration mapping, but the data groups on different regression lines are still artificially divided.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Unitary linear point-by-point analysis method, system and device for standardized residual error test method
  • Unitary linear point-by-point analysis method, system and device for standardized residual error test method
  • Unitary linear point-by-point analysis method, system and device for standardized residual error test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0196] Such as figure 1 As shown, the point-by-point analysis example of two unary linear regression lines

[0197] The standardized residual test method of unary linear point-by-point analysis is often used in the analysis of two unary linear regression lines. The following is a point-by-point analysis of two linear regression lines in the shape of "┛"

[0198] (1) Experimental data set

example 1

[0199] Example 1: A set of experimental data sets are shown in Table 2-1:

[0200] Table 2-1 Example of α-acid determination in hops

[0201]

[0202] (2) One-variable linear point-by-point analysis

[0203] Starting from N=4, a linear regression calculation was performed on the first 4 sets of data. get:

[0204] the y 4 =a+bx=0.5954+0.06714x(2-1)

[0205] r 1 =0.9706

[0206] Check the correlation coefficient critical value table r 0.05,4 , is 0.950, and the actual calculated r value is 0.9706, which is greater than 0.950, indicating that the established regression equation (2-1) has a significant correlation, and the unary linear regression equation is meaningful.

[0207] Then the calculation of residuals and standardized residuals is performed. The results are shown in Table 2-2.

[0208] Table 2-2 Residual values ​​and standardized residuals when N=4

[0209]

[0210]

[0211] It can be seen from Table 2-2 that the absolute value of the actual calculat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a unitary linear point-by-point analysis method, system and device for a standardized residual error test method, and the method comprises the steps: S1, building a mathematic model of unitary linear point-by-point analysis, and setting a data group as x1, x2, x3, x4,..., xi, xi+1,..., xyny1, y2, y3, y4,..., yi, yi+1,..., yn, wherein one or two or more unary linear regression straight lines may exist in the data set, and the equation expression of one unary linear regression straight line is set to be yi=a+bx(1-1). According to the invention, the application of a standardized residual error test method for testing abnormal values is extended, a unary linear point-by-point analysis method of the standardized residual error test method is established, and a typical mathematical model is analyzed by utilizing the technology, so that the problem of tedious work of manually completing conductivity titration measurement is solved; and meanwhile, the determination rangeof the conductivity titration analysis is expanded, projects which cannot be subjected to the conductivity titration analysis in the past can be completed by the conductivity titration analysis, andthe characteristics of simplicity, quickness and accuracy of the conductivity titration analysis are truly realized.

Description

technical field [0001] The invention belongs to the technical field of chemical analysis, and is especially aimed at automatically determining the titration end point in conductometric titration analysis. The method is organically combined with an electronic burette and a conductivity measuring instrument to realize automatic completion of conductometric titration analysis. Background technique [0002] In a set of conductometric titration data sets, the independent variable and the dependent variable show a significant linear relationship, and the first linear regression equation is obtained through regression. When other factors remain unchanged, as the independent variable changes point by point, another characteristic change occurs in the dependent variable. The change of this characteristic and the subsequent independent variable and dependent variable form another unary linear correlation, that is, the second unary linear regression equation. These two unary linear re...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/11G06F17/18G01N31/16
CPCG06F17/11G06F17/18G01N31/164
Inventor 李建国
Owner XINJIANG ACADEMY OF AGRI & RECLAMATION SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products