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A clamping mechanism for a drop tester

A technology of clamping mechanism and testing machine, which is applied in the direction of measuring device, impact test, machine/structural component test, etc. It can solve the problems such as difficulty in adjusting the drop test height and single drop test results

Active Publication Date: 2022-07-01
萍乡伊博智能科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, it is difficult for the above-mentioned electronic product drop test equipment to adjust the drop test height to meet the detection requirements of the product under test for various heights, and the drop test results are relatively single

Method used

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  • A clamping mechanism for a drop tester
  • A clamping mechanism for a drop tester

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Embodiment Construction

[0022] The technical solutions of the present invention are further described below with reference to the accompanying drawings and through specific embodiments.

[0023] like figure 1 and figure 2As shown, a clamping mechanism for a drop tester provided in this embodiment includes a first clamping group 1, a second clamping group 2 and a horizontal feeding mechanism 3. The first clamping group 1 and the first clamping group The two clamping groups 2 are distributed parallel to each other. The power output end of the horizontal feeding mechanism 3 is fixedly connected with the second clamping group 2. The horizontal feeding mechanism 3 can drive the second clamping group 2 to perform reciprocating feeding motion. A clamping group 1 cooperates to clamp or release the sample to be tested. The horizontal feeding mechanism 3 performs a horizontal feeding movement, which can drive the second clamping group 2 to perform a reciprocating feeding movement synchronously. When the sec...

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Abstract

The invention discloses a clamping mechanism for a drop testing machine, belonging to the technical field of drop testing. The nut end of a ball screw drive group is fixedly connected with the slider end of a guide rail slider group, and a first clamping group passes through a mounting beam. The group is fixedly connected to the power output end of the lifting and feeding mechanism, the second clamping group is movably connected to the mounting beam group through the slider end of the guide rail slider group, and the lifting and feeding mechanism can drive the first clamping group through the mounting beam group. And the second clamping group makes up and down reciprocating motion, the ball screw drive group can drive the second clamping group to slide back and forth on the guide rail end of the guide rail slider group through the slider end of the guide rail slider group, so that the second clamping group can move back and forth. The group cooperates with the first clamping group to clamp or release the sample to be tested. The clamping mechanism for a drop testing machine disclosed by the invention not only ensures that the clamping mechanism can realize the clamping or loosening action stably and reliably, but also can be adapted to test prototypes of various sizes and specifications and perform batch drop detection. At the same time, it is easy to adjust the clamping height.

Description

technical field [0001] The invention relates to the technical field of drop testing, in particular to a clamping mechanism for a drop testing machine. Background technique [0002] All kinds of electronic products may be damaged due to accidental fall during the use of electronic products. Therefore, major global brand manufacturers and parts manufacturers have increased product drop tests. Most of the damage to electronic products comes from falling and collision. R&D personnel often spend a lot of time and cost to do relevant quality tests for products. The most common structural tests are drop and impact tests. [0003] Chinese Patent Document Publication No. CN209416640U discloses a drop test machine, the drop test machine includes a frame, a drop part, a test part and a receiving assembly, the drop part is arranged on the frame to receive the dropped sample, The testing part is movably arranged on the frame through a lifting device, and the testing part can move betwee...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M7/08
CPCG01M7/08
Inventor 周礼信
Owner 萍乡伊博智能科技有限公司
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