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Spectral measurement method and device

A technology for spectral measurement and data processing devices, which is applied in the field of spectral measurement devices, can solve the problems of low light utilization, demand, and high cost of spectrometers, and achieve the effect of improving sensitivity, resolution, and low cost

Pending Publication Date: 2020-07-28
南京伯克利新材料科技有限公司
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AI Technical Summary

Problems solved by technology

Since the incident slit only allows a very narrow light beam to enter, the optical signal will be very weak, and only part of the light intensity can be used after the dispersion element splits the light, thereby further weakening the optical signal intensity; and the engraving of the grating is very precise, reaching several hundred per millimeter. Even thousands of etch lines, which require expensive
[0004] Therefore, traditional spectrometers have low light utilization, weak optical signals, large volume, and require high cost

Method used

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  • Spectral measurement method and device
  • Spectral measurement method and device
  • Spectral measurement method and device

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Embodiment Construction

[0036] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0037] One of the core ideas of the embodiments of the present invention is that by dividing N first color filter units and N first transmission units on the gradient color filter and the transmitted light image obtained after being filtered by the gradient filter, respectively, And select N wavelength positions with evenly spaced wavelengths on the first transmission unit, and then obtain the transmission curve of the first color filter unit and the transmitted light intensity of the first transmission unit by measuring, so as to construct N incident light intensity x including wavelength positions n By solving the equation, the spectrum of the light to be measured can be obtained, that is, the distribution of the light intensity ...

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Abstract

The embodiment of the invention provides a spectral measurement method and device. The spectral measurement method comprises the following steps: converting to-be-measured light into transmission light data through a color filter device; converting the transmission light data into a transmission light image through a data processing device, dividing the transmission light image into N first transmission units, and calculating the transmission light intensity P of the first transmission units; selecting n wavelength positions with uniformly-spaced wavelengths in the first transmission unit, andestablishing an equation containing incident light intensity xn corresponding to the wavelength positions according to the transmission light intensity P and the transmissivity [alpha]n correspondingto the wavelength positions; and establishing N equations containing the transmission light intensity Pm of the incident light intensity xn, and calculating the spectrum of the light to be measured.According to the invention, the sensitivity and resolution of spectral measurement are improved, and slits and gratings are not needed, so that high-quality spectral data can be obtained with low cost.

Description

technical field [0001] The invention relates to the technical field of spectrum measurement, in particular to a spectrum measurement method and a spectrum measurement device. Background technique [0002] A spectrometer is an important device for measuring the spectral characteristics of light sources and substances, and is the most basic analytical instrument in spectroscopy and spectroscopic technology. It is widely used in environmental monitoring, lighting testing, LED brightness color temperature color rendering index, industrial control, chemical analysis, food quality testing, material analysis, clinical testing, aerospace remote sensing and science education and other fields. [0003] A spectrometer is an instrument that decomposes complex light into spectral lines and measures the spectrum. The traditional spectrometer converts the incident light into the object point of the spectrometer imaging system by setting the incident slit, and then the light emitted by the...

Claims

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Application Information

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IPC IPC(8): G01J3/28G01J3/02
CPCG01J3/0227G01J3/2803G01J3/2823G01J2003/2826
Inventor 董翊
Owner 南京伯克利新材料科技有限公司
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