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High-fidelity image reconstruction method and system, computer equipment and storage medium

An image reconstruction, high-fidelity technology, applied in computing, image enhancement, image data processing and other directions, can solve problems such as matching

Active Publication Date: 2020-05-12
SUZHOU INST OF BIOMEDICAL ENG & TECH CHINESE ACADEMY OF SCI
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Problems solved by technology

However, the PSF measured using fluorescent microspheres is only an approximate PSF, which still cannot strictly match the imaging conditions.

Method used

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  • High-fidelity image reconstruction method and system, computer equipment and storage medium
  • High-fidelity image reconstruction method and system, computer equipment and storage medium
  • High-fidelity image reconstruction method and system, computer equipment and storage medium

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[0088] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0089] The high-fidelity image reconstruction method of super-resolution structured light illumination microscope provided by the present invention is not only applicable to the reconstruction of 2D-SIM and 3D-SIM data, but also applicable to nonlinear structured light illumination microscope (NL-SIM) Super-resolution image reconstruction is suitable for data processing of almost all SIM systems based on the principle of structured light lighting technology.

[0090] In one embodiment, such as figure 2 As shown, a high-fidelity image reconstruction method (HiFi-SIM) for ...

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Abstract

The invention discloses a high-fidelity image reconstruction method and system, computer equipment and a storage medium. The method comprises the steps of reading an SIM image; generating or reading ameasurement PSF; estimating structured light stripe parameters; and reconstructing a high-fidelity SIM super-resolution image by using a spectrum optimization method. The system comprises an image acquisition module, a parameter estimation module (PSF generation module) and an image reconstruction module. Computer equipment and a storage medium can realize the process of the method by executing acomputer program. According to the method, the problem of artifacts of the SIM super-resolution image can be effectively solved, high-fidelity reconstruction of the SIM super-resolution image is realized, and the axial layer cutting capability of the 2D-SIM technology can be greatly improved, so that the 2D-SIM technology obtains the layer cutting capability comparable to that of the 3D-SIM technology, and the application scene of the 2D-SIM technology is effectively expanded. In addition, a theoretical generated PSF is used for replacing a complex PSF measurement process, and a high-fidelitySR-SIM super-resolution image can still be reconstructed. The method is suitable for almost all data processing of the SIM system based on the structured light illumination technology principle.

Description

technical field [0001] The invention relates to the fields of super-resolution microscopic imaging and three-dimensional surface measurement using structured light illumination technology, in particular to a high-fidelity image reconstruction method, system, computer equipment and storage medium for a super-resolution structured light illumination microscope. Background technique [0002] Super-resolution Structured Illumination Microscopy (SR-SIM) is a wide-field microscopy imaging technique that can break through the Abbe diffraction limit, because of its advantages of non-invasiveness, fast imaging speed and small optical damage. It has been widely used in biomedical research. SIM technology utilizes structured light with intensity sinusoidal distribution to illuminate the observed sample to produce "Moiré effect", which can encode high-frequency information that cannot be directly detected within the range of the optical transfer function of the microscopic objective len...

Claims

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Application Information

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IPC IPC(8): G06T3/40G06T5/00G06F17/14
CPCG06T3/4061G06F17/14G06T5/70Y02T10/40
Inventor 文刚李辉李思黾王林波梁永金鑫陈晓虎
Owner SUZHOU INST OF BIOMEDICAL ENG & TECH CHINESE ACADEMY OF SCI
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